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pro vyhledávání: '"Amuru, Deepthi"'
Autor:
Amuru, Deepthi, Vudumula, Harsha V., Cherupally, Pavan K., Gurram, Sushanth R., Ahmad, Amir, Zahra, Andleeb, Abbas, Zia
An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time
Externí odkaz:
http://arxiv.org/abs/2202.10015
Autor:
Amuru, Deepthi, Zahra, Andleeb, Vudumula, Harsha V., Cherupally, Pavan K., Gurram, Sushanth R., Ahmad, Amir, Abbas, Zia
Publikováno v:
In Integration November 2023 93
