Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Amran Al-Aghbari"'
Publikováno v:
IEEE Access, Vol 7, Pp 38009-38019 (2019)
A novel platform for launching and using field-programmable gate arrays (FPFA) custom computing machines (CCMs) in clouds and data centers is proposed. Based on a developed FPGA virtualization scheme, it allows users to create independent computing s
Publikováno v:
Microprocessors and Microsystems. 62:61-71
Though Field-Programmable Gate Arrays (FPGAs) have achieved significant performance gains for many application domains, implementing applications on FPGAs still remains a non-trivial task. This is especially true for FPGAs in a Data Center or a cloud
Autor:
Mohammed Al-Asli, Muhammad E. S. Elrabaa, Ayman Hroub, Muhamed F. Mudawar, Ahmad Khayyat, Amran Al-Aghbari
Publikováno v:
IEEE Transactions on Parallel and Distributed Systems. 28:3033-3045
Simulation is the main tool for computer architects and parallel application developers for developing new architectures and parallel algorithms on many-core machines. Simulating a many-core architecture represent a challenge to software simulators e
Autor:
Aiman H. El-Maleh, Mohammad Alshayeb, Mohammad Al-Asli, Muhammad E. S. Elrabaa, Abdelhafid Bouhraoua, Amran Al-Aghbari
Publikováno v:
Integration. 54:1-9
A novel low-cost platform for prototyping and characterizing the performance of digital circuit intellectual properties (IPs) has been developed. Compromised of several HW/SW components, it allows developers of circuit IPs to verify the functionality
Publikováno v:
2013 Saudi International Electronics, Communications and Photonics Conference.
A novel method for the high-speed test and characterization of digital integrated circuit prototypes has been developed. It utilizes a specially developed off-chip processor and supporting circuitry that is to be included on the prototype chip to fac
Autor:
Muhammad E. S. Elrabaa, Aiman H. El-Maleh, Abdelhafid Bouhraoua, Amran Al-Aghbari, Ayman Hroub, Mohammad Alshayeb
Publikováno v:
Journal of Circuits, Systems and Computers. 24:1550027
The Standard Test Interface Language (STIL) is the de-facto standard for transferring test data between the test generation environment and the test equipment. STIL's flexibility and extensibility facilitates its use as the sole input language for au