Special session on machine learning: How will machine learning transform test?

Autor: Marc Reuben Hutner, Haralampos-G. Stratigopoulos, Yiorgos Makris, Amit Nahar

Publikováno v: VTS

This special session will discuss how machine learning can transform test. The first talk will review the key challenges and will argue whether contemporary tools, such as deep learning, could offer any advantages over traditional methods. The second

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cccc9cdebd38047dcb71b4bc29810b30
https://doi.org/10.1109/vts.2018.8368667

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations

Autor: Ali Ahmadi, John Carulli, Ke Huang, Bob Orr, Haralampos-G. Stratigopoulos, Amit Nahar, Yiorgos Makris, Michael F. Pas

Publikováno v: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2017, 36 (12), pp.2120-2133. ⟨10.1109/TCAD.2017.2669861⟩
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2017, 36 (12), pp.2120-2133. ⟨10.1109/TCAD.2017.2669861⟩

International audience; Yield estimation is an indispensable piece of information at the onset of high-volume production of a device, as it can inform timely process and design refinements in order to achieve high yield, rapid ramp-up, and fast time-

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::58abd8a68d760a8ed2f53145dc671b2b
https://hal.archives-ouvertes.fr/hal-02980993/document

What we know after twelve years developing and deploying test data analytics solutions

Autor: W. Robert Daasch, Amit Nahar, Kenneth M. Butler

Publikováno v: ITC

Since 2004, Texas Instruments and Portland State University have collaborated to develop and deploy test data analytical methods for use in a variety of applications, including quality screening, burn-in minimization, high cost test replacement and/o

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0a11855fe4f0b2a0505117fcb028a18a
https://doi.org/10.1109/test.2016.7805844

Harnessing process variations for optimizing wafer-level probe-test flow

Autor: Michael F. Pas, Constantinos Xanthopoulos, Ali Ahmadi, Bob Orr, Amit Nahar, Yiorgos Makris

Publikováno v: ITC

We propose a methodology for dynamically selecting an optimal probe-test flow which reduces test cost without jeopardizing test quality. The granularity of this decision is at the wafer-level and is made before the wafer reaches the probe station, ba

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3c0b255c896589eb8e301a1fc033648d
https://doi.org/10.1109/test.2016.7805835

Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs

Autor: Bob Orr, Amit Nahar, Yiorgos Makris, Ali Ahmadi, Michael Past

Publikováno v: VTS

We introduce a methodology for dynamically selecting whether to subject a wafer to a complete or a reduced probe-test flow, while ensuring that the concomitant test cost savings do not compromise test quality. The granularity of this decision is at t

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5d07d59b789ae95a2d08dbe45e249bf0
https://doi.org/10.1109/vts.2016.7477263