Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Amit Bavisi"'
Autor:
Filippo Neri, Gus Mehas, Fabio Di Fazio, Giovanni Figliozzi, Jure Menart, Marcin Augustyniak, Turev Acar, Amit Bavisi
Publikováno v:
2023 IEEE International Solid- State Circuits Conference (ISSCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4fb3cf7acf9c5615e154225df91ffcf1
https://doi.org/10.1109/isscc42615.2023.10067848
https://doi.org/10.1109/isscc42615.2023.10067848
Publikováno v:
Microwave and Optical Technology Letters. 53:664-666
In this article, the design and measurement of a 77-GHz Marchand balun matched to 50 Ω single-ended and 100 Ω differential-ends using multiple metal layers in silicon technology is discussed. The balun is measured with an insertion loss of 1.8 dB a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de955ad2db9c5e828c1ccff4f407e3ad
https://doi.org/10.1002/mop.25756
https://doi.org/10.1002/mop.25756
Publikováno v:
2007 Asia-Pacific Microwave Conference.
Although the discontinuity structures in the microstrip transmission lines such as a gap have been largely studied, the three-dimensional edge effects, skin effects and metal losses have hardly been analyzed in the model. In this paper, an accurate m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::30e534b6b7865e82eaf5419118bf7273
https://doi.org/10.1109/apmc.2007.4554949
https://doi.org/10.1109/apmc.2007.4554949
Autor:
Kwanhim Lam, Hanyi Ding, Guoan Wang, D. Jordan, A. Zeeb, Brian P. Gaucher, Amit Bavisi, Essam Mina
Publikováno v:
2007 European Microwave Conference.
In this paper, the modeling, design, and measurement of on-chip compact millimeter-wave branch line couplers are discussed. These couplers are realized with the Back End of Line (BEOL) wiring and enabled as a library device of a 0.13 micron SiGe BiCM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa6a154ede34ff922c4efbc03361a0dd
https://doi.org/10.1109/eumc.2007.4405226
https://doi.org/10.1109/eumc.2007.4405226