Zobrazeno 1 - 10
of 50
pro vyhledávání: '"Amir Avishai"'
Publikováno v:
ACS Applied Electronic Materials. 4:5550-5557
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5930c9aeb3758d7d0247f64aa643615
https://doi.org/10.1021/acsaelm.2c01149
https://doi.org/10.1021/acsaelm.2c01149
Autor:
Brandon G. Radoman‐Shaw, Ralph P. Harvey, Gustavo Costa, Nathan S. Jacobson, Amir Avishai, Leah M. Nakley, Daniel Vento
Publikováno v:
Meteoritics & Planetary Science. 57:1796-1819
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b64ac0b81991a4a8e64c6c18b5d916a
https://doi.org/10.1111/maps.13902
https://doi.org/10.1111/maps.13902
Autor:
Mythili Surendran, Boyang Zhao, Guodong Ren, Shantanu Singh, Amir Avishai, Huandong Chen, Jae-Kyung Han, Megumi Kawasaki, Rohan Mishra, Jayakanth Ravichandran
Perovskite chalcogenides have emerged as a new class of semiconductors with tunable band gap in the visible-infrared region. High quality thin films are critical to understand the fundamental properties and realize the potential applications based on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::23eedd706e182c6c3512d2c8f1e5e864
Autor:
Eugen Foca, Dmitry Klochkov, J. T. Neumann, Keum Sil Lee, Ramani Pichumani, Thomas Korb, Amir Avishai, Sheetal B. Gupta, Alex Buxbaum
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXIV.
We demonstrate the application of 3D tomography by FIB-SEM to analyze channel holes in 3D-NAND. We automatically analyze the 3D channel profiles for size, shape, and placement from the reconstructed full 3D volume. As the data contains thousands of h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45409f12cfd3a63edd6706f496bf2138
https://doi.org/10.1117/12.2552006
https://doi.org/10.1117/12.2552006
Publikováno v:
J Vis Exp
With advances in electronics and fabrication technology, intracortical microelectrodes have undergone substantial improvements enabling the production of sophisticated microelectrodes with greater resolution and expanded capabilities. The progress in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::983a8ccc7ac2118f20d89eeb220b9932
https://doi.org/10.3791/60004-v
https://doi.org/10.3791/60004-v
Autor:
P. G. Neudeck, David J. Spry, Gustavo C. C. Costa, Amir Avishai, Gary W. Hunter, Robert S. Okojie, Dorothy Lukco, Ralph P. Harvey, Leah M. Nakley
Publikováno v:
Earth and Space Science. 5:270-284
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f223a6402b17d000bb45f5ce115305b0
https://doi.org/10.1029/2017ea000355
https://doi.org/10.1029/2017ea000355
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper describes the application of 3D FIB-SEM tomography as a method for quantifying process variations across the die and across the wafer, as well as layout investigations. In this study, the analysis of results acquired by 3D FIB-SEM tomograp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ae20e3fb0673bee66f126006f426cc4
https://doi.org/10.31399/asm.cp.istfa2019p0209
https://doi.org/10.31399/asm.cp.istfa2019p0209
Autor:
Amir Avishai, Aidin Rashidi, Ina T. Martin, Sepideh Razavi, Christopher L. Wirth, Marola W. Issa
Publikováno v:
ACS applied materialsinterfaces. 10(37)
Janus particles have anisotropy in surface chemistry or composition that will effect dynamics and interactions with neighboring surfaces. One specific type of Janus particle is that consisting of a native micrometer-scale particle with a cap of gold,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::43d021248563c2eb5c5ed88ace0ee85a
https://pubmed.ncbi.nlm.nih.gov/30142982
https://pubmed.ncbi.nlm.nih.gov/30142982
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 24(4)
Electron backscattered diffraction (EBSD) is a technique regularly used to obtain crystallographic information from inorganic samples. When EBSD is acquired simultaneously with emitting diodes data, a sample can be thoroughly characterized both struc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::19cc8b3c78e576e975a5f85089405ad4
https://pubmed.ncbi.nlm.nih.gov/29925461
https://pubmed.ncbi.nlm.nih.gov/29925461