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pro vyhledávání: '"Amin Zhai"'
Publikováno v:
Ultramicroscopy. 194:126-132
Mapping the charge distribution in nano scale systems still is a difficult task, but is important to provide fundamental insights into the properties of materials. We demonstrate how in-line holography in transmission electron microscopy can be used
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::16c403dcdcf5f5d358fc553226439d3c
https://doi.org/10.1016/j.ultramic.2018.08.006
https://doi.org/10.1016/j.ultramic.2018.08.006
