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pro vyhledávání: '"Amgad Rashed"'
Autor:
Amgad Rashed Naji, Ammer Zain Othman
Publikováno v:
University of Aden Journal of Natural and Applied Sciences. 24:463-474
In this article, we prove Malinnikova’s result for Weinstein operator as follows: Let \({(ɸ_n)}_{n=1}^∞\) be an orthonormal basis for \(L_α^2 (R_+^d )\). If the sequences \({(e_n)}_{n=1}^∞⊂R_+^d\) and \({(a_n)}_{n=1}^∞⊂R_+^d\) are bound
Publikováno v:
University of Aden Journal of Natural and Applied Sciences. 23:479-487
The aim of this paper is to prove new variations of uncertainty principles for Weinstein operator. The first of these results is variation of Heisenberg-type in equality for Weinstein transform that is for s>0. Then, there exists a constant C(α,s),
Autor:
Néjib Ben Salem, Amgad Rashed Nasr
Publikováno v:
Integral Transforms and Special Functions. 27:846-865
Using harmonic analysis associated with the Weinstein operator on R+d ΔW=∑j=1d∂2∂xj2+2α+1xd∂∂xd,α>−12, we study the associated Poisson semigroup. Next, in this context, we study the Littlewood–Paley function denoted gα(f). Especiall
Autor:
Amgad Rashed Nasr, Néjib Ben Salem
Publikováno v:
Integral Transforms and Special Functions. 26:700-718
The aim of this paper is to prove new uncertainty principles for the Weinstein operator. The first of these results is a sharp Heisenberg-type inequality for the Weinstein transform, that is, for s≥1 and f∈Lα2(R+d), ‖|x|sf‖Lα2(R+d)‖|ξ|sF
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2015, 55 (1), pp.81-92. ⟨10.1016/j.microrel.2014.09.008⟩
Microelectronics Reliability, Elsevier, 2015, 55 (1), pp.81-92. ⟨10.1016/j.microrel.2014.09.008⟩
This paper presents fast test protocols for ageing IGBT modules in power cycling conditions, and a monitoring device that tracks the on-state voltage V CE and junction temperature T J of IGBTs during ageing test operations. This device is implemented
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f1c3320af115c2475102fafde6178d06
https://hal.archives-ouvertes.fr/hal-01629261
https://hal.archives-ouvertes.fr/hal-01629261
Publikováno v:
2013 15th European Conference on Power Electronics and Applications (EPE).
This paper describes a part of a larger supervision system able to monitor the on-state voltage VCE and the junction temperature TJ of IGBT in operation. That system is associated to an ageing test bench stressing IGBT modules by power cycling. All a
Akademický článek
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Akademický článek
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Autor:
Salem, Néjib Ben, Nasr, Amgad Rashed
Publikováno v:
Integral Transforms & Special Functions; Nov2016, Vol. 27 Issue 11, p846-865, 20p
Autor:
Salem, Néjib Ben, Nasr, Amgad Rashed
Publikováno v:
Integral Transforms & Special Functions; Sep2015, Vol. 26 Issue 9, p700-718, 19p