Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Ameet Chavan"'
Publikováno v:
Journal of Low Power Electronics and Applications, Vol 2, Iss 2, Pp 168-179 (2012)
A novel Single Event Upset (SEU) tolerant flip-flop design is proposed, which is well suited for very-low power electronics that operate in subthreshold ( < Vt ≈ 500 mV). The proposed flip-flop along with a traditional (unprotected) flip-flop, a Se
Externí odkaz:
https://doaj.org/article/2178c9dfdab74164ab8c0facccf43074
Publikováno v:
Journal of Low Power Electronics and Applications, Vol 2, Iss 4, Pp 210-210 (2012)
We have found the following error in the title of this article which was recently published in J. LowPower Electron. Appl. [...]
Externí odkaz:
https://doaj.org/article/5272ac1f6c2a45f996e669816f5fdf06
Publikováno v:
2022 International Conference for Advancement in Technology (ICONAT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95be296f79228a783b6d04e5b62355fb
https://doi.org/10.1109/iconat53423.2022.9725957
https://doi.org/10.1109/iconat53423.2022.9725957
Publikováno v:
Intelligent Systems and Sustainable Computing ISBN: 9789811900105
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94d05af3229b0257cfdcd7dd02ad9d13
https://doi.org/10.1007/978-981-19-0011-2_51
https://doi.org/10.1007/978-981-19-0011-2_51
Publikováno v:
Advances in Robotics, Automation and Data Analytics ISBN: 9783030709167
The proposed work analyzes the Single Event Transients (SETs) in combinational circuits and Single Event Upsets (SEUs) in sequential elements for 16 nm FinFET device structures implemented using Visual TCAD tool. The FinFET CMOS circuits of tradition
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c1b4d714a73e72eeece121577ec7c443
https://doi.org/10.1007/978-3-030-70917-4_20
https://doi.org/10.1007/978-3-030-70917-4_20
Publikováno v:
2020 IEEE International Conference for Innovation in Technology (INOCON).
The implementation of an AI-IoT based Healthcare Prognosis Interactive System is discussed in this paper. The purpose of the system is to provide expertise in real-time medical diagnosis and support patients in the absence of healthcare workers. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61f117afaab0d5a628fcaa906e15fc8a
https://doi.org/10.1109/inocon50539.2020.9298232
https://doi.org/10.1109/inocon50539.2020.9298232
Publikováno v:
2020 IEEE International Conference for Innovation in Technology (INOCON).
The speed control of autonomous car is an important aspect of a driver less vehicle. This paper presents a solution for longitudinal motion speed control of autonomous vehicle. The primary objective is to achieve a smooth and safe control of speed fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::33bd8d26338f28bb4e4189c053e01a22
https://doi.org/10.1109/inocon50539.2020.9298213
https://doi.org/10.1109/inocon50539.2020.9298213
Publikováno v:
2020 IEEE International Conference for Innovation in Technology (INOCON).
Autonomous vehicle employ multiple sensors and algorithms to analyze data streams from the sensors to accurately interpret the surroundings. The aim of the research presented in this paper is to design a sensor fusion algorithm that predicts the next
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8be3ac82970784b69868b3b57f735bb
https://doi.org/10.1109/inocon50539.2020.9298316
https://doi.org/10.1109/inocon50539.2020.9298316
Publikováno v:
2020 IEEE International Conference for Innovation in Technology (INOCON).
In this paper, an effective solution for the steering control system which is indeed an important part to build the autonomous vehicle is presented. A Model Predictive Controller (MPC) is designed to control the steering angle. Vehicle is controlled
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b8c31457f3d8cbfd7b0eb5002b08dea
https://doi.org/10.1109/inocon50539.2020.9298205
https://doi.org/10.1109/inocon50539.2020.9298205
Publikováno v:
2020 4th International Conference on Electronics, Communication and Aerospace Technology (ICECA).
The proposed work investigates the operational robustness and design reliability of 2D and 3D structures of the designed nano-scale devices and circuits, when irradiated by high-energy particles. The TID analysis are performed on 22nm FinFET devices,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62d17613c49066083d0aa1dfcfb57cc1
https://doi.org/10.1109/iceca49313.2020.9297573
https://doi.org/10.1109/iceca49313.2020.9297573