Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Amandine Aubert"'
Autor:
Mélanie Diogo, Jean-Paul Rebrassé, Raphael Perdreau, Fabien Allanic, Tony Moinet, Nicolas Vivet, Amandine Aubert
Publikováno v:
Materials Sciences and Applications. :326-347
In active semiconductor devices, the junction characteristics are critical for the electrical performance. As an alternative of the atomic force microscopy (AFM)-based electrical techniques which provide unique junction characterization, other method
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76d24224cd7a71502c91f5dc4338e64f
https://doi.org/10.4236/msa.2016.76030
https://doi.org/10.4236/msa.2016.76030
Autor:
Carlos Angulo Barrios, Juan Carlos Jimenez, Sebastian Lourdudoss, F. Olsson, Jesper Berggren, Manuel Avella, Amandine Aubert
Publikováno v:
ECS Transactions. 3:23-29
Epitaxial lateral overgrowth of InP was performed on patterned silicon-on-insulator (SOI) and compared with that on Si substrates in a low pressure hydride vapor phase epitaxy system. The InP was characterized by cathodoluminescence. No red shift of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc2a6010f3fb0444b263db92c2a9169b
https://doi.org/10.1149/1.2818558
https://doi.org/10.1149/1.2818558
Autor:
Stéphanie Pétremont, Amandine Aubert, Lionel Dantas de Morais, Hélène Fremont, Nathalie Labat
This paper presents a new sample preparation process for front side access for die with organic dielectric layers that are encapsulated in plastic packages. The limitation of the standard failure analysis flow is firstly described, showing the damage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3cdf3f97b4639c06bbbaeff3e73f3d54
https://hal.archives-ouvertes.fr/hal-00670567
https://hal.archives-ouvertes.fr/hal-00670567
Autor:
Fredrik K. Olsson, Amandine Aubert, Manuel Avella, Juan Jimnez, Jesper Berggren, Sebastian Lourdudoss
Publikováno v:
ECS Meeting Abstracts. :1260-1260
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9dbfbfecf271d9965b1351d54d68827
https://doi.org/10.1149/ma2006-02/26/1260
https://doi.org/10.1149/ma2006-02/26/1260