Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Alyssa J. Fielitz"'
Autor:
Jonathan Schwartz, Zichao Wendy Di, Yi Jiang, Alyssa J. Fielitz, Don-Hyung Ha, Sanjaya D. Perera, Ismail El Baggari, Richard D. Robinson, Jeffrey A. Fessler, Colin Ophus, Steve Rozeveld, Robert Hovden
Publikováno v:
npj Computational Materials, Vol 8, Iss 1, Pp 1-8 (2022)
Abstract Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions. Here, fused multi-modal electron microscopy offers high signal-to-noise ratio (SNR) recover
Externí odkaz:
https://doaj.org/article/df61540dcd0145a1870da11d5eb72d7f
Autor:
Keith E. L. Husted, Abraham Herzog-Arbeitman, Denise Kleinschmidt, Wenxu Zhang, Zehao Sun, Alyssa J. Fielitz, An N. Le, Mingjiang Zhong, Jeremiah A. Johnson
Publikováno v:
ACS Central Science. 9:36-47
Autor:
Jeremy M. Beebe, Dongchan Ahn, Donald V. Eldred, Alyssa J. Fielitz, Tyler R. Heyl, Myoungbae Lee, Shane Mangold, Eric Z. Pearce, Carl W. Reinhardt, Cheryl Roggenbuck, Justin M. Scherzer, Kenneth R. Shull, Anthony J. Silvaroli, Yu-Jing Tan, Muzhou Wang
Publikováno v:
Macromolecules. 55:5826-5839
Autor:
Christian Kisielowski, Alyssa J. Fielitz, David F. Yancey, Anthony Salazar, Steven J. Rozeveld, David G. Barton, Petra Specht, Joo Kang, Dirk Van Dyck, Oscar D. Dubon
Publikováno v:
Microscopy and Microanalysis, vol 27, iss 6
Microscopy and microanalysis
Microscopy and microanalysis
Technological opportunities are explored to enhance detection schemes in transmission electron microscopy (TEM) that build on the detection of single-electron scattering events across the typical spectrum of interdisciplinary applications. They range
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e3545a5d9c4a7d86872e68bb38717237
https://escholarship.org/uc/item/91481957
https://escholarship.org/uc/item/91481957
Autor:
Alyssa J Fielitz, Jeremy M Beebe, Dongchan Ahn, Marius Chyasnavichyus, Tyler R Heyl, Myoungbae Lee, Shane Mangold, Carl Reinhardt, Kenneth R Shull, Anthony J Silvaroli, Muzhou Wang
Publikováno v:
Microscopy and Microanalysis. 28:222-223
Autor:
Christian Kisielowski, Petra Specht, Steve Rozeveld, Bert Freitag, Erik R. Kieft, Joo Kang, Alyssa J. Fielitz, Thomas R. Fielitz, Dirk van Dyck, David F. Yancey
Publikováno v:
Advanced functional materials
Ultra-low-dose electron diffraction is performed with a double metal cyanide catalyst (DMC) to understand how electron irradiation stimulates structural alterations in functional materials. The commonly fading diffraction patterns with dose accumulat
Autor:
Alyssa J. Fielitz, Anthony J Silvaroli, Myoungbae Lee, Muzhou Wang, Tyler R Heyl, Jeremy M. Beebe, Dongchan Ahn, Kenneth R. Shull, Shane L Mangold
Publikováno v:
Microscopy and Microanalysis. 27:2000-2001