Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Altet Sanahujes, Josep"'
Autor:
Fornt Mas, Jordi, Jin, Leixin, Etxezarreta, Imanol, Fontova, Pau, Altet Sanahujes, Josep, Calomarde Palomino, Antonio, Morancho Llena, Enrique, Moll Echeto, Francisco de Borja, Rubio Sola, Jose Antonio
Publikováno v:
2022 37th Conference on Design of Circuits and Integrated Circuits (DCIS).
© 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new c
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
Universitat Jaume I
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
Universitat Jaume I
This paper introduces a novel on-chip measurement technique for the determination of the central frequency and 3dB bandwidth of a 60GHz power amplifier (PA) by performing low frequency temperature measurements in silicon integrated circuits. The tech
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a3849efbacae522a706016811b692238
https://hdl.handle.net/2117/22055
https://hdl.handle.net/2117/22055
Autor:
Altet Sanahujes, Josep, Gómez Salinas, Dídac, Dufis, Cédric Yvan, González Jiménez, José Luis, Mateo Peña, Diego, Aragonès Cervera, Xavier, Moll Echeto, Francisco de Borja, Rubio Sola, Jose Antonio
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
The temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures of merit (FoM) of some digital an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::cba049e10eb06a3adf9f869a7856be0e
https://hdl.handle.net/2117/11126
https://hdl.handle.net/2117/11126
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
In this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::38398c344e09c3be935cb6d345c65c36
https://hdl.handle.net/2117/10718
https://hdl.handle.net/2117/10718
Autor:
Perpiñà, Xavier, Altet Sanahujes, Josep|||0000-0002-6939-6475, Jordà, Xavier, Vellvehi, Miquel
Publikováno v:
Recercat. Dipósit de la Recerca de Catalunya
instname
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
instname
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Thermal management of nano estructures requires the use of temperature monitoring strategies. In this work we expose a strategy bases on sensing the heat-flux within the chip substrate with a probe-laser beam. As the beam passes through the die, it e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f7a4ffd0bf6455c72af5c85edf525fd9
https://hdl.handle.net/2117/10650
https://hdl.handle.net/2117/10650
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
This paper describes the structure and thermal behavior of a high-power thermal test chip (up to 200 W/cm2) designed for power electronics package assessment, which has also been used for the validation of thermal measurement techniques. In particula
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::77193d3be01642edd2440efd2ab4707f
http://hdl.handle.net/2117/10519
http://hdl.handle.net/2117/10519
Autor:
Rubio Sola, Jose Antonio, Altet Sanahujes, Josep, Aragonès Cervera, Xavier, González Jiménez, José Luis, Mateo Peña, Diego, Moll Echeto, Francisco de Borja
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
La tecnología de circuitos integrados, basada principalmente en la miniaturización de los circuitos ha evolucionado intensamente en los últimos tiempos. El objetivo de esta obra es dar a conocer esta evolución reciente y futura, sus posibilidades
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::17e6897d6669810ab581736f12b3d69a
http://hdl.handle.net/2099.3/36851
http://hdl.handle.net/2099.3/36851
Autor:
Altet Sanahujes, Josep|||0000-0002-6939-6475, Mateo Peña, Diego|||0000-0001-5996-9092, Gómez Salinas, Dídac
Publikováno v:
Recercat. Dipósit de la Recerca de Catalunya
instname
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
instname
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
In the present paper we analyze that DC temperature measurements of the silicon surface can be used to monitor the high frequency status and performances of class A RF Power Amplifiers. As a proof of concept, we present experimental results obtained
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::bccd2b532f7f36d509f0e305835a4d7d
http://hdl.handle.net/2117/16657
http://hdl.handle.net/2117/16657
Autor:
Navarro Paredes, Carlos
Today the use of arithmetic operators is present in all fields of electronics and is used by a very wide range of technologies. Typically, these arithmetic circuits have always stood out for having high time response and for using a large amount of l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3484::2cd1ca24773e0faa765ecd38f3cb96bd
https://hdl.handle.net/2117/388356
https://hdl.handle.net/2117/388356