Zobrazeno 1 - 1
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pro vyhledávání: '"Allan Dobbin"'
Autor:
Kushagra Bhatheja, Shravan Chaganti, Degang Chen, Xiankun Robert Jin, Chris C Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R Knight, Allan Dobbin, Scott W Herrin, Doug Garrity
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60b842bc343bd0192b794ef13f51ac56
https://doi.org/10.1109/itc50671.2022.00063
https://doi.org/10.1109/itc50671.2022.00063
