Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Alirad Malek"'
Publikováno v:
ACM Transactions on Embedded Computing Systems. 15:1-25
In this article, we describe RQNoC, a service-oriented Network-on-Chip (NoC) resilient to permanent faults. We characterize the network resources based on the particular service that they support and, when faulty, bypass them, allowing the respective
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d639466a0455895d4f424c87d0f1af10
https://doi.org/10.1145/2846097
https://doi.org/10.1145/2846097
Autor:
Christos Strydis, Stavros Tzilis, Alirad Malek, Ioannis Sourdis, Georgios Smaragdos, Danish Anis Khan
Publikováno v:
IEEE Micro. Chips, Systems, Software and Applications, 36(1), 35-45. IEEE Computer Society
This article presents a chip multiprocessor (CMP) design that mixes coarse- and fine-grained reconfigurability to increase core availability of safety-critical embedded systems in the presence of hard errors. The authors conducted a comprehensive des
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::12ac55c2af365abebd1c9489e631f457
https://doi.org/10.1109/mm.2015.7
https://doi.org/10.1109/mm.2015.7
Publikováno v:
MEMSYS
An application may have different sensitivity to faults in different subsets of the data it uses. Some data regions may therefore be more critical than others. Capitalizing on this observation, Odd-ECC provides a mechanism to dynamically select the m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbe679dcb1817436b128669670223c19
https://doi.org/10.1145/3132402.3132443
https://doi.org/10.1145/3132402.3132443
Autor:
Christos Strydis, Georgios Smaragdos, Ioannis Sourdis, Alirad Malek, Danish Anis Khan, Stavros Tzilis
Publikováno v:
DFTS
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, 191-196
STARTPAGE=191;ENDPAGE=196;TITLE=Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, 191-196
STARTPAGE=191;ENDPAGE=196;TITLE=Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015
Permanent faults on a chip are often tolerated using spare resources. In the past, sparing has been applied to Chip Multiprocessors (CMPs) at various granularities of substitutable units (SUs). Entire processors, pipeline stages or even individual fu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::692660dfae705ed9a0403f02f84b911b
https://doi.org/10.1109/dft.2015.7315161
https://doi.org/10.1109/dft.2015.7315161
Autor:
Georgios Smaragdos, Stavros Tzilis, Alirad Malek, Ioannis Sourdis, Christos Strydis, Danish Anis Khan
Publikováno v:
IPDPS Workshops
Proceedings-IEEE 28th International Parallel and Distributed Processing Symposium Workshops, IPDPSW 2014, 141-150
STARTPAGE=141;ENDPAGE=150;TITLE=Proceedings-IEEE 28th International Parallel and Distributed Processing Symposium Workshops, IPDPSW 2014
Proceedings-IEEE 28th International Parallel and Distributed Processing Symposium Workshops, IPDPSW 2014, 141-150
STARTPAGE=141;ENDPAGE=150;TITLE=Proceedings-IEEE 28th International Parallel and Distributed Processing Symposium Workshops, IPDPSW 2014
Recent trends in semiconductor technology have dictated the constant reduction of device size. One negative effect stemming from the reduction in size and increased complexity is the reduced device reliability. This paper is centered around the matte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0137d61491f6366cf44e3a3a0614c2ee
https://doi.org/10.1109/ipdpsw.2014.20
https://doi.org/10.1109/ipdpsw.2014.20
Autor:
Georgios Smaragdos, Ioannis Sourdis, Alirad Malek, Danish Anis Khan, Stavros Tzilis, Christos Strydis
Publikováno v:
Proceedings-IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 141-146
STARTPAGE=141;ENDPAGE=146;TITLE=Proceedings-IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
DFT
STARTPAGE=141;ENDPAGE=146;TITLE=Proceedings-IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
DFT
Reconfigurable hardware can be employed to tolerate permanent faults. Hardware components comprising a System-on-Chip can be partitioned into a handful of substitutable units interconnected with reconfigurable wires to allow isolation and replacement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1115421c918a63a9fba7d61fa77cd3c
https://pure.eur.nl/en/publications/a21ef0b3-f9e4-4ad6-bcc7-7042bd463cd8
https://pure.eur.nl/en/publications/a21ef0b3-f9e4-4ad6-bcc7-7042bd463cd8
Autor:
Georgi Gaydadjiev, Riccardo Mariani, Sebastian Isaza, Alirad Malek, Dionisios Pnevmatikatos, Robert M. Seepers, Christos Strydis, Babak Falsafi, Christos-Savvas Bouganis, Antonino Armato, Dhiraj K. Pradhan, Michalis Vavouras, Samuel Pagliarini, Ioannis Sourdis, Gerard Rauwerda, Rishad Shafik, Dimitris Theodoropoulos, Georgios Smaragdos, Stavros Tzilis
Publikováno v:
Reconfigurable Computing: Architectures, Tools, and Applications-10th International Symposium, ARC 2014, Proceedings, 312-317
STARTPAGE=312;ENDPAGE=317;TITLE=Reconfigurable Computing
Lecture Notes in Computer Science ISBN: 9783319059594
ARC
STARTPAGE=312;ENDPAGE=317;TITLE=Reconfigurable Computing
Lecture Notes in Computer Science ISBN: 9783319059594
ARC
The DeSyRe project builds on-demand adaptive, reliable Systems-on-Chips. In response to the current semiconductor technology trends thatmake chips becoming less reliable, DeSyRe describes a newgeneration of by design reliable systems, at a reduced po
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c9b1f590520ecaf20eb9441a10cbfad7
https://pure.eur.nl/en/publications/d7965f3b-3061-4e1d-9109-8df9f1f60ea0
https://pure.eur.nl/en/publications/d7965f3b-3061-4e1d-9109-8df9f1f60ea0
Autor:
Riccardo Mariani, Georgi Gaydadjiev, Kim Sunesen, Dhiraj K. Pradhan, Gerard Rauwerda, Stavros Tzilis, Ioannis Sourdis, Alirad Malek, Babak Falsafi, Christos-Savvas Bouganis, Dionisios Pnevmatikatos, C. Strydis
Publikováno v:
DSD
Proceedings-15th Euromicro Conference on Digital System Design, DSD 2012, 335-342
STARTPAGE=335;ENDPAGE=342;TITLE=Proceedings-15th Euromicro Conference on Digital System Design, DSD 2012
Proceedings-15th Euromicro Conference on Digital System Design, DSD 2012, 335-342
STARTPAGE=335;ENDPAGE=342;TITLE=Proceedings-15th Euromicro Conference on Digital System Design, DSD 2012
The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e89fd6e413a27d1dc8cf6116398612ac
https://doi.org/10.1109/dsd.2012.127
https://doi.org/10.1109/dsd.2012.127
Publikováno v:
SiPS
In this paper a VLSI implementation of a highly scalable MMSE (Minimum Mean Square Estimator) is presented with the ultimate goal of demonstrating the potential of MMSE as enabler for multi-standard channel estimation. By selecting an appropriate imp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13d1f841438c5ab08bce0fdf7abc3e8b
https://doi.org/10.1109/sips.2011.6088995
https://doi.org/10.1109/sips.2011.6088995
Publikováno v:
COMPSAC (2)
In this paper, a microcontroller-based Additive White Gaussian Noise Generator (AWGNG) for security enhancement of embedded real-time web services running on embedded boards is presented. The scheme utilizes combination of Windows Embedded Standard b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0264e0590ea5baaa6265a37727bd014a
https://doi.org/10.1109/compsac.2009.123
https://doi.org/10.1109/compsac.2009.123