Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Alicia Ding"'
Publikováno v:
2020 China Semiconductor Technology International Conference (CSTIC).
Modern artificial intelligence and the internet-of-things (AI/loT) drive many aspects of semiconductor technologies. Power ICs and devices need to achieve superior quality and reliability to match the high performance of AI/loT systems. This is achie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7e32a3ee5e455ee7dfbd304d6a0eb58
https://doi.org/10.1109/cstic49141.2020.9282489
https://doi.org/10.1109/cstic49141.2020.9282489
Autor:
Francisco Cruzalegui, Shruti Desai, Lieping Chen, Nicole Gianino, David L. Rimm, Alain Robert, Brian S. Henick, Jon Zugazagoitia, Miguel F. Sanmamed, Pierre Ferré, Alicia Ding, Roy S. Herbst, Kurt A. Schalper, Franz Villarroel-Espindola, Adam Ducler
Publikováno v:
Cancer Research. 80:5525-5525
Introduction. VISTA/PD-1H is an Ig domain-containing type I transmembrane protein able to suppress T-cell activation and is being evaluated as a candidate anti-cancer immunotherapy target. VISTA can bind P-selectin glycoprotein ligand-1 (PSGL1) and V
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45bdd5a5011b82b3b7b7d0032663ad13
https://doi.org/10.1158/1538-7445.am2020-5525
https://doi.org/10.1158/1538-7445.am2020-5525
Autor:
Kai Rejeski, Radovan Vasic, Poorval Joshi, Anastasia Ardasheva, Stephanie Halene, Kunthavai Balasubramanian, Yuanbin Song, Yang Liang, Alessandro Quattrone, Giovanni Stefani, Ashley Taylor, Jamie Maziarz, Alicia Ding, Toma Tebaldi
Publikováno v:
Leukemia
Recurrent mutations in the splicing factor SRSF2 are associated with poor clinical outcomes in myelodysplastic syndromes (MDS). Their high frequency suggests these mutations drive oncogenesis, yet the molecular explanation for this process is unclear
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2075276b67d9a91db6eef009f9bfa00f
https://pubmed.ncbi.nlm.nih.gov/29858584
https://pubmed.ncbi.nlm.nih.gov/29858584
Autor:
Ming Li, Susie Yu, Alicia Ding, Wei-Ting Kary Chien, Jack Chen, Gang Niu, Dennis Zhang, Silvia Duan, Daniel Zhao
Publikováno v:
2017 China Semiconductor Technology International Conference (CSTIC).
Package Level Threshold Voltage Stability (VTS) evaluation on PMOS has emerged as one of the critical reliability concerns in deep sub-micron devices. In this paper, we present a novel method to fast measure VTS at wafer level. Our result shows that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8e403e1d8e1a11467e6d91e6bca79c6
https://doi.org/10.1109/cstic.2017.7919852
https://doi.org/10.1109/cstic.2017.7919852
Autor:
Rani, Haslina, Yean Hua, Michelle Su, Sue Ann, Alicia Ding, Yahya, Nurul Asyikin, Jaafar, Azlan
Publikováno v:
Journal of International Dental & Medical Research; 2019, Vol. 12 Issue 2, p640-644, 5p, 1 Chart, 3 Graphs