Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Ali Niknejad"'
Autor:
Christos Adamopoulos, Panagiotis Zarkos, Sidney Buchbinder, Pavan Bhargava, Ali Niknejad, Mekhail Anwar, Vladimir Stojanovic
Publikováno v:
IEEE Open Journal of the Solid-State Circuits Society, Vol 1, Pp 198-208 (2021)
The recent pandemic has shown that accurate and on-demand information on various infections requires highly versatile, Point-of-Care (PoC) platforms providing diagnostic and prognostic multiparametric information, personalized to each patient. Despit
Externí odkaz:
https://doaj.org/article/d81a38e7e1c344518937f1f0de16bf64
Publikováno v:
Biosensors, Vol 10, Iss 11, p 177 (2020)
Multiplexed sensing in integrated silicon electronic-photonic platforms requires microfluidics with both high density micro-scale channels and meso-scale features to accommodate for optical, electrical, and fluidic coupling in small, millimeter-scale
Externí odkaz:
https://doaj.org/article/044ce4ae30fc4c50841c2fb3f7c6c889
Autor:
Ali Niknejad, Nima Baniasadi
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 69:2276-2283
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 69:2752-2756
Autor:
Meng Wei, Nima Baniasadi, Ethan Chou, Hesham Beshary, Sashank Krishnamurthy, Elad Alon, Ali Niknejad
Publikováno v:
2022 IEEE Asian Solid-State Circuits Conference (A-SSCC).
Autor:
Ethan Chou, Nima Baniasadi, Hesham Beshary, Meng Wei, Emily Naviasky, Lorenzo Iotti, Ali Niknejad
Publikováno v:
ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC).
Autor:
Luya Zhang, Ali Niknejad
Publikováno v:
2022 IEEE International Solid- State Circuits Conference (ISSCC).
Autor:
Yogesh Singh Chauhan, Chenming Hu, S. Salahuddin, Girish Pahwa, Avirup Dasgupta, Darsen Lu, Sriramkumar Vanugopalan, Sourabh Khandelwal, Juan Pablo Duarte, Navid Payvadosi, Ali Niknejad
FinFET/GAA Modeling for IC Simulation and Design: Using the BSIM-CMG Standard, Second Edition is the first to book to explain FinFET modeling for IC simulation and the industry standard – BSIM-CMG - describing the rush in demand for advancing the t
Autor:
Dobrila Petrovic, Ali Niknejad
Publikováno v:
Computers & Industrial Engineering. 111:228-238
As production networks grow globally, their complexity and susceptibility to risk are increasing as well. Due to internal and external factors, risks affect individual network nodes and their impact propagates through the network to affect other node
Publikováno v:
Conference on Lasers and Electro-Optics.