Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Ali Mohammadi-Gheidari"'
Autor:
David A. Muller, Maarten Bischoff, Lena F. Kourkoutis, Anna Carlsson, Berit H. Goodge, Greg Schwind, Ali Mohammadi-Gheidari, Christian Maunders, Gamal Fallag
Publikováno v:
Microscopy and Microanalysis. 26:1508-1511
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d2f10e7210920191d817210d30c4270
https://doi.org/10.1017/s1431927620018358
https://doi.org/10.1017/s1431927620018358
Autor:
Neda Hesam Mahmoudi Nezhad, Pieter Kruit, Mohamad Ghaffarian Niasar, Cornelis W. Hagen, Ali Mohammadi Gheidari
Publikováno v:
Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 39(6)
The design of an electrostatic electron optical system with five electrodes and two objective functions is optimized using multiobjective genetic algorithms (MOGAs) optimization. The two objective functions considered are minimum probe size of the pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76929463eaee6971d3bee616adfae739
http://resolver.tudelft.nl/uuid:dc7bc067-edb7-4838-94a5-f76194b38120
http://resolver.tudelft.nl/uuid:dc7bc067-edb7-4838-94a5-f76194b38120
Autor:
Pieter Kruit, Ali Mohammadi Gheidari
Publikováno v:
2009 22nd International Vacuum Nanoelectronics Conference.
Electron beam instruments give the highest resolution, both in microscopy and in lithography. Their weak point is the low beam current at high resolution and thus their low throughput. Multi-beam systems can increase the throughput by orders of magni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfce9dbe66dc7bc6b6c600620ae95767
https://doi.org/10.1109/ivnc.2009.5271609
https://doi.org/10.1109/ivnc.2009.5271609
Autor:
Ali Mohammadi-Gheidari, Pieter Kruit
Publikováno v:
2009 22nd International Vacuum Nanoelectronics Conference.
The progress in microelectronics, micro-fabrication and material science demands an ever-increasing spatial resolution and throughput in charged particle beam lithography and inspection but conventional single beam systems are not able to meet these
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b76d16344c8831e30df7ceed5b9b748
https://doi.org/10.1109/ivnc.2009.5271608
https://doi.org/10.1109/ivnc.2009.5271608
Publikováno v:
Proceedings of ISES World Congress 2007 (Vol. I – Vol. V) ISBN: 9783540759966
Transparent conductive oxides are widely used in solar cell applications. These layers have low electrical resistance that can reduce the top contact losses by reducing series resistance and increasing the fill factor of the cell. On the contrary, du
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a512c96fb7b4bfd21254351803e95330
https://doi.org/10.1007/978-3-540-75997-3_190
https://doi.org/10.1007/978-3-540-75997-3_190
Autor:
Neda Hesam Mahmoudi Nezhad, Mohamad Ghaffarian Niasar, Ali Mohammadi-Gheidari, Teun Janssen, Cornelis Wouter Hagen, Pieter Kruit
Publikováno v:
Delft University of Technology
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fa1bbccb68e3924baeb70fd6e36e7b88
https://research.tudelft.nl/en/publications/7fb1bc86-2feb-4274-b9e9-c326b08e0e9d
https://research.tudelft.nl/en/publications/7fb1bc86-2feb-4274-b9e9-c326b08e0e9d