Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Ali Doğuş Güngördü"'
Publikováno v:
Analog Integrated Circuits and Signal Processing. 113:241-248
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdf837f20e4d8e4e1964c50246b23c3d
https://doi.org/10.1007/s10470-022-02100-4
https://doi.org/10.1007/s10470-022-02100-4
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 12, Pp 281-288 (2024)
This paper presents a machine-learning-based approach for the degradation modeling of hot carrier injection in metal-oxide-semiconductor field-effect transistors (MOSFETs). Stress measurement data have been employed at various stress conditions of bo
Externí odkaz:
https://doaj.org/article/42728040a3d64e968f403d6a587a2a49