Zobrazeno 1 - 10
of 55
pro vyhledávání: '"Alfred M. Kriman"'
Publikováno v:
Material Science & Engineering International Journal. 1
Quilt Packaging QP is a new direct interchip interconnect through metal nodules on chip edges We have performed simulations to study the robustness of QP against fatigue failure For quilts on ceramic carriers thermal stresses are driven primarily by
Autor:
Gary H. Bernstein, Mohammad Ashraf Khan, Quanling Zheng, Patrick Fay, Alfred M. Kriman, David Kopp
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 4:400-407
We investigate mechanical, thermal, and microwave characteristics of the edge-interconnect scheme called quilt packaging (QP), using a pin transfer method for the application of solder paste. A novel pull test method for QP is introduced, and the pul
Autor:
M. Ashraf Khan, Jason M. Kulick, David Kopp, Patrick Fay, Alfred M. Kriman, Gary H. Bernstein
Publikováno v:
Journal of Microelectronics and Electronic Packaging. 10:8-14
Quilt packaging (QP) is a novel high-speed super-connect (i.e., direct interchip interconnect), developed to improve electrical performance—signal delay, power loss, and so on. Ultrahigh bandwidth has already been demonstrated for QP, but its uniqu
Publikováno v:
International Symposium on Microelectronics. 2012:000524-000530
Quilt Packaging (QP) is a novel high-speed superconnect (i.e. direct interchip interconnect), developed to improve electrical performance — signal delay, power loss, etc. Ultrahigh bandwidth has already been demonstrated for QP, but its unique stru
Publikováno v:
International Symposium on Microelectronics. 2012:000441-000446
Electrical and mechanical performance of Quilt Packaging (QP), a 2D system-in-package chip-to-chip interconnection, is presented. QP employs contacts at the edges of integrated circuit dies along their vertical surfaces. Based on 3D HFSS simulations,
Autor:
Quanling Zheng, Patrick Fay, Alfred M. Kriman, Jason M. Kulick, Wayne Buckhanan, Gary H. Bernstein, David Kopp, M. Ashraf Khan
Publikováno v:
Journal of Electronic Packaging. 137
The continued progress of micro-electronics often requires functionality that is spread across multiple chips. This need has led to the development of a variety of alternative chip-packaging technologies that offer increased speed and bandwidth, with
Autor:
Howwen Jou, Alfred M. Kriman
Publikováno v:
Superlattices and Microstructures. 19:203-216
We determine the current distributions in conducting strips whose resistivity and Hall angle vary with longitudinal position along the wire. We consider isolated, finite rectangular Hall bars between semi-infinite leads, as well as periodic structure
Publikováno v:
2010 18th Biennial University/Government/Industry Micro/Nano Symposium.
This paper discusses thermal reliability simulations of Quilt Packaging (QP), a novel chip-to-chip interconnect technology. A simulation model of QP is developed. The issue of reliability arises due to the different coefficients of thermal expansion
Publikováno v:
Semiconductor Science and Technology. 7:B243-B247
The authors describe a many-body semiclassical approximation for simulating electronic motion. Semiclassical trajectories in this approach are determined from spin-dependent forces and effective mass corrections, which incorporate effects of Heisenbe
Publikováno v:
Journal of Physics: Condensed Matter. 3:6605-6612
The authors report magnetotransport measurements and the quantum Hall effect in lateral surface superlattices, realized in GaAs/AlGaAs high mobility heterojunctions with grid gates. They observe perturbation or destruction of the integer quantum Hall