Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Alfred L. Crouch"'
Autor:
Kundan Nepal, Jennifer Dworak, Alfred L. Crouch, Soha Alhelaly, Ping Gui, Theodore W. Manikas
Publikováno v:
IEEE Transactions on Emerging Topics in Computing. 9:774-786
3D integrated circuits introduce both advantages and disadvantages for security. Among the disadvantages unique to 3D is the potential insertion of a Trojan die into the stack between two legitimate dies. Such a die could be used to snoop information
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f74e5264e1fc47f8b69bb25ec24cac5f
https://doi.org/10.1109/tetc.2020.2984162
https://doi.org/10.1109/tetc.2020.2984162
Autor:
Adam W Ley, Alfred L. Crouch
Publikováno v:
2019 IEEE AUTOTESTCON.
Our 2019 AUTOTESTCON paper [1] introduced the concept of hardware assurance for security and trust that focused on Trojan payloads and triggers and the use of embedded instruments and data collection from those instruments as one of the detection str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::88ac9db9fffd949657eecb729f9ca7e8
https://doi.org/10.1109/autotestcon43700.2019.8961081
https://doi.org/10.1109/autotestcon43700.2019.8961081
Publikováno v:
2019 IEEE AUTOTESTCON.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c9aca2391b1cc90c937c2f76d08e373
https://doi.org/10.1109/autotestcon43700.2019.8961903
https://doi.org/10.1109/autotestcon43700.2019.8961903
Publikováno v:
VTS
The IEEE 1687–2014 standard introduced the concept of portable, retargetable tests for digital circuits and taught how to apply them via a JTAG Test Access Port. Two follow-on standardization efforts address the topics of portable, retargetable ana
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5dfd6d4d5a2772d42075781e704b1338
https://doi.org/10.1109/vts.2019.8758629
https://doi.org/10.1109/vts.2019.8758629
Autor:
Peilin Song, Daniel W. Engels, Yuhe Xia, Jennifer Dworak, Ping Gui, Gary A. Evans, Chi Zhang, Alfred L. Crouch, Lakshmi Ramakrishnan, Peter L. Levin, Franco Stellari, Saurabh Gupta, Scott McWilliams, Naigang Wang
Publikováno v:
VTS
The term CyberSecurity means many different things to many people - some think of data security, some think of identity protection, some think of intrusion attacks on the internet or USB ports. In reality, CyberSecurity represents any type of attack
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f22199c409fa2f4cb1ed5527853c073
https://doi.org/10.1109/vts.2019.8758665
https://doi.org/10.1109/vts.2019.8758665
Publikováno v:
VTS
The IP session focuses on using Machine Learning (ML) techniques on several emerging applications. The first contribution discusses hotspot detection by using ML. The second presentation then talks a data-driven health monitoring solution. The last c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f3d64afd8be0c31e6520297985151b3b
https://doi.org/10.1109/vts.2018.8368654
https://doi.org/10.1109/vts.2018.8368654
Autor:
Kundan Nepal, Jennifer Dworak, Ping Gui, Alfred L. Crouch, Soha Alhelaly, Theodore W. Manikas
Publikováno v:
NATW
While 3D integrated circuits provide many security advantages, one disadvantage is the insertion of a Trojan die into the stack. In this paper, we explore a technique to detect an extra die through delay analysis.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cd3ade57a3bdd44fa5ba0675970769a
https://doi.org/10.1109/natw.2017.7938027
https://doi.org/10.1109/natw.2017.7938027
Publikováno v:
IEEE Design & Test. 30:6-14
This article discusses the embedding of a tester on an FPGA, which uses IJTAG to enable flexible and dynamic access to test configurations of the on-chip instruments.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::872c2354d9061be782c7cd2cbf0e3688
https://doi.org/10.1109/mdat.2013.2278531
https://doi.org/10.1109/mdat.2013.2278531
Autor:
Alfred L. Crouch, John C. Potter
Publikováno v:
DAC
In this paper, we describe the use of manufacturing scan-based vectors to structurally assess the frequency of any given semiconductor design, as opposed to the complex and costly effort of creating a functional set of vectors that can actually exerc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::72470089724e2db45d3be497abdaa4db
https://doi.org/10.1145/2897937.2905001
https://doi.org/10.1145/2897937.2905001
Autor:
Alfred L. Crouch
Publikováno v:
EDFA Technical Articles. 7:16-24
Scan chains help detect and identify failures in integrated circuits, but they are also susceptible to failure themselves. When scan chains break, it does not necessarily render them useless. Normally, scan chains can be debugged and diagnosed so tha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::153d7077d72bf06fecf7e7c4aa40b5f6
https://doi.org/10.31399/asm.edfa.2005-1.p016
https://doi.org/10.31399/asm.edfa.2005-1.p016