Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Alfons Zöller"'
Autor:
Mark Schürmann, Josephine Wolf, Lars Mechold, Kai Starke, Martin Bischoff, Michael Kennedy, Henrik Ehlers, Thomas Hegemann, Olaf Stenzel, Norbert Kaiser, S Schippel, Florian Carstens, Tobias Nowitzki, R Rauhut, Rüdiger Foest, Detlev Ristau, J. Harhausen, Holger Reus, Jens Schumacher, Harro Hagedorn, Alfons Zöller, Steffen Wilbrandt
Publikováno v:
Applied optics. 56(4)
Random effects in the repeatability of refractive index and absorption edge position of tantalum pentoxide layers prepared by plasma-ion-assisted electron-beam evaporation, ion beam sputtering, and magnetron sputtering are investigated and quantified
Publikováno v:
Optical Interference Coatings 2016.
High throughput and accuracy of a PIAD coating system with a large dome and an advanced RF-plasma source is demonstrated. Thickness monitoring was performed with a newly developed wideband monitoring system.
Autor:
Jens Harhausen, Kai Starke, Olaf Stenzel, Roman Rauhut, Lars Mechold, Mark Schürmann, Josephine Wolf, Holger Reus, Rüdiger Foest, Detlev Ristau, Martin Bischoff, Michael Kennedy, Harro Hagedorn, Henrik Ehlers, Florian Carstens, Steffen Wilbrandt, Alfons Zöller, Tobias Nowitzki, Jens Schumacher, Norbert Kaiser, Thomas Hegemann, Stefan Schippel
Publikováno v:
Optical Interference Coatings 2016.
Random effects in the reproducibility of refractive index and absorption edge position of Ta2O5 layers prepared by plasma-ion assisted electron beam evaporation, ion beam sputtering, and magnetron sputtering are investigated and quantified.
Autor:
Alfons Zöller
Publikováno v:
Vakuum in Forschung und Praxis. 19:6-10
Single wavelength optical monitoring is frequently applied in large box coaters. In state of the art optical coating systems a testglass changer with stationary test glasses is used for thickness monitoring while the substrates are located on a rotat
Publikováno v:
SPIE Proceedings.
A newly developed wideband optical monitoring system is based on a fast triggered spectrometer with a high dynamic array detector with low signal noise. It is useful for fast in-situ transmittance measurements on the rotating substrate holder during
Publikováno v:
SPIE Proceedings.
A new, highly efficient impedance matching network is introduced , increasing the LION300 RF-source efficiency by approximately 20% and enabling considerably higher SiO2 rates for the production of shift-free and low scattering interference filters.
Autor:
Alfons Zöller
Publikováno v:
Vakuum in Forschung und Praxis. 9:19-24
Ein plasmaunterstutztes Aufdampfverfahren zur Herstellung optisch wirksamer dunner Schichten fuhrt bereits bei niederen Substrattemperaturen zu hervorragenden Schichteigenschaften. Anhand der Untersuchungen von Einzelschichten im Vergleich zum konven
Publikováno v:
Optical Interference Coatings.
The performance of a PIAD process with RF-plasma source in a large box coater is investigated in respect to high performance coatings. UV-IR cut and BP-filters with low losses are presented.
Autor:
Alfons Zöller, Boris Romanov, Jennifer D. T. Kruschwitz, Michael K. Trubetskov, Michael Boos, Harro Hagedorn, Alexander V. Tikhonravov
Publikováno v:
Optifab 2007: Technical Digest.
The success of fabrication of optical coatings depends on a proper choice of a theoretical coating design and on the choice of monitoring strategy that provides low thickness errors for the chosen design. Software tools described in this presentation
Publikováno v:
Optical Interference Coatings.
The performance of a new large rf-plasma source for large box coaters is investigated in respect to layer performance and achievable growth rates. The optical constants of SiO2 and TiO2 thin films are presented.