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pro vyhledávání: '"Alfitrah Bachtiar"'
Autor:
Sumari Sumari, Devi Indrasari Mustopa Putri, Siti Khoirun Nisak, Alfitrah Bachtiar, Aman Santoso
Publikováno v:
AIP Conference Proceedings.
Publikováno v:
THE 4TH INTERNATIONAL CONFERENCE ON MATHEMATICS AND SCIENCE EDUCATION (ICoMSE) 2020: Innovative Research in Science and Mathematics Education in The Disruptive Era.
Characterization of crystal surface topography using Atomic Force Microscopy (AFM) is very important in crystal growth study since this instrument can reach Angstrom lateral resolution. Other than that, the AFM can also work well in air or liquid. Th