Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Alexis Kallis"'
Publikováno v:
Wu, Y C, Jiang, J, Wang, S J, Kallis, A & Coleman, P G 2011, ' Porosity and crystallization of water ice films studied by positron and positronium annihilation ', Physical Review B, vol. 84, no. 6, 064123 . https://doi.org/10.1103/PhysRevB.84.064123
The growth, evolution, and annealing of closed and interconnected pores in amorphous and crystalline films of water ice grown under a range of conditions have been studied by variable-energy positron annihilation spectroscopy (VEPAS). By measuring po
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e1cc11009fcfd34558e30a6bf3e094da
https://purehost.bath.ac.uk/ws/files/233366/Coleman_PRB_2011_84_6_064123.pdf
https://purehost.bath.ac.uk/ws/files/233366/Coleman_PRB_2011_84_6_064123.pdf
Autor:
Iain F. Crowe, Paul G. Coleman, Matthew P. Halsall, Jonathan D. B. Bradley, O. Hulko, D.V. Stevanovic, Andrew P. Knights, Alexis Kallis, C J Edwards, Russell M. Gwilliam
Publikováno v:
Knights, A P, Bradley, J D B, Hulko, O, Stevanovic, D V, Edwards, C J, Kallis, A, Coleman, P G, Crowe, I F, Halsall, M P & Gwilliam, R M 2011, ' Probing the formation of silicon nano-crystals (Si-ncs) using variable energy positron annihilation spectroscopy ', Journal of Physics: Conference Series, vol. 262, no. 1, 012031 . https://doi.org/10.1088/1742-6596/262/1/012031
We describe preliminary results from studies of the formation of silicon nano-crystals (Si-ncs) embedded in stoichiometric, thermally grown SiO 2 using Variable Energy Positron Annihilation Spectroscopy (VEPAS). We show that the VEPAS technique is ab
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a1bbc23b2ad5238c456ed6d24a538036
https://purehost.bath.ac.uk/ws/files/264391/Coleman_JoPConfSer_2011_262_012031.pdf
https://purehost.bath.ac.uk/ws/files/264391/Coleman_JoPConfSer_2011_262_012031.pdf
Autor:
Anthony J. Kenyon, D. Barbier, H Saleh, MP Temple, WH Loh, M Wojdak, Claudio J. Oton, I Ahmad, Alexis Kallis
Erbium-doped silicon-rich silicon oxide films deposited by plasma enhanced chemical vapor deposition suffer from compressive stress as deposited, which converts to a large tensile stress on annealing due to the release of hydrogen. Although the crack
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::00816445f002cd00f67dc0e68656cc0a
http://hdl.handle.net/11382/510988
http://hdl.handle.net/11382/510988
Publikováno v:
Journal of Physics: Conference Series. 262:012065
Corrosion-related defects in pure Al and AA 2037 Al alloy have been investigated by positron beam-based Doppler broadening energy spectroscopy. Defect profiles have been analyzed by measuring the S parameter as a function of incident positron energy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2c5e9cbf2b3d018f4832680f76fc03f
https://doi.org/10.1088/1742-6596/262/1/012065
https://doi.org/10.1088/1742-6596/262/1/012065
Autor:
Paul G. Coleman, Alexis Kallis
Publikováno v:
Coleman, P G & Kallis, A 2011, ' Development of a spin-polarised positron beam ', Journal of Physics: Conference Series, vol. 262, no. 1, 012016 . https://doi.org/10.1088/1742-6596/262/1/012016
The development stages of a system for variable-energy spin-polarised positron beam spectroscopy are described. Methods for achieving maximum practical beam polarisation include a Na-22 source configuration with a low-Z backing to reduce positron bac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94d68917ea2d478e3398ea676b453e22
https://doi.org/10.1088/1742-6596/262/1/012016
https://doi.org/10.1088/1742-6596/262/1/012016
Autor:
Russell M. Gwilliam, Alexis Kallis, Vlad Stolojan, Andrew P. Knights, Paul G. Coleman, A. J. Smith, S. H. Yeong
Publikováno v:
Journal of Applied Physics. 106:103514
The concentration of vacancy-type defects in a silicon-on-insulator substrate consisting of a 110 nm overlayer and a 200 nm buried oxide has been quantified using variable energy positron annihilation spectroscopy following 300 keV Si+ ion implantati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbdac083b778ce005d82434fddafe866
https://doi.org/10.1063/1.3262527
https://doi.org/10.1063/1.3262527
Autor:
Anthony J. Kenyon, Ijaz Ahmad, Matthew Temple, Alexis Kallis, Maciej Wojdak, Claudio Oton, Harith Saleh, Denis Barbier, Wei Loh
Publikováno v:
ECS Meeting Abstracts. :756-756
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::548bd6ed79862a2cb5b35eb09592f159
https://doi.org/10.1149/ma2009-01/17/756
https://doi.org/10.1149/ma2009-01/17/756