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pro vyhledávání: '"Alexey Yu. Egorov"'
Autor:
Vladislav D. Kalashnikov, Alexey Yu. Egorov, Armen V. Sogoyan, Anastasia V. Ulanova, Andrey B. Karakozov, Pavel A. Balamutov
Publikováno v:
Безопасность информационных технологий, Vol 27, Iss 3, Pp 98-103 (2020)
In this work, the effect of the irradiation intensity on the radiation hardness of CMOS integrated circuits (ICs) was studied. We investigated 3 types of ICs manufactured according to design rules from 0.8 to 3 microns, and used in various informatio
Externí odkaz:
https://doaj.org/article/751d1c2bb82e414793e9b2769406bd9c
