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pro vyhledávání: '"Alexandre Avenet"'
Autor:
Alexandre Avenet, Franck Flourens, Thiemo Stadtler, Jean-Alain Rouquette, Nicole Rouvrais, Robert Kebel
Publikováno v:
IEEE Electromagnetic Compatibility Magazine. 5:71-79
Measurement or numeric simulation are well known means in the EMC business. Both can give an early idea of the electromagnetic protective performance of a particular design that should be optimized for example to provide for lightning protection. Mea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::446921fc5eb45e858625fa37f2c51e0a
https://doi.org/10.1109/memc.2016.7866238
https://doi.org/10.1109/memc.2016.7866238
