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Autor:
Leandro T. Núñez A, Tulio C. R. Rocha, Simón Oyarzún, S. Michea, Stefan Eisebitt, T. J. A. Mori, Juan Escrig, Juliano C. Denardin, Dieter Engel, Samuel Flewett, Christian M. Günther, Alexandra Ovalle F, Manuel Fohler, Bastian Pfau, D. Mishra
Publikováno v:
Physical Review B. 95
In this work, we take a step toward nanometer resolution magnetic tomography, demonstrating the use of resonant magnetic x-ray scattering for three-dimensional (3D) characterization of Co/Pd multilayers. Trading coherence for x-ray flux, we measured
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e453073badb249c0e88bd01a5346fdd
https://doi.org/10.1103/physrevb.95.094430
https://doi.org/10.1103/physrevb.95.094430
