Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Alexandr Tikhii"'
Publikováno v:
Springer Proceedings in Physics ISBN: 9783030198930
The results of X-ray diffraction analysis, spectrophotometry, ellipsometry of thin films of the ferroelectric-relaxor Ba0.5Sr0.5Nb2O6 (SBN-50) deposited on Al2O3 (001) and MgO (001) crystal substrates are presented. It is established that the natural
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48a95a9dcdb00e869985e8c82cdbeaa9
https://doi.org/10.1007/978-3-030-19894-7_22
https://doi.org/10.1007/978-3-030-19894-7_22
Autor:
I. V. Zhikharev, Alexandr Tikhii, N. V. Korchikova, Yuriy I. Yurasov, Vladimir A. Gritskikh, S. V. Kara-Murza, Tatyana V. Krasnyakova, Yuri M. Nikolaenko, Anatoly V. Pavlenko
Publikováno v:
Springer Proceedings in Physics ISBN: 9783319560618
The In2O3 films were deposited by dc-magnetron sputtering on substrates of Al2O3 (012) at different temperatures (20–600 °C). Ellipsometric and optical transmission measurements were used to investigate the effect of substrate temperature and anne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18d4f58acd33fd9487cb47436eaf43e1
https://doi.org/10.1007/978-3-319-56062-5_5
https://doi.org/10.1007/978-3-319-56062-5_5
Autor:
Natalia Korchikova, Vladimir Gritskih, Igor Zhikharev, Yuri M. Nikolaenko, S. V. Kara-Murza, Alexandr Tikhii
Publikováno v:
physica status solidi c. 10:673-676
We report on the influence of temperature conditions of deposition and annealing given on the optical conductivity spectra of LSMO films. The investigated films were deposited using DC magnetron sputtering of La0.7Sr0.3MnO3 target in argon-oxygen atm