Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Alexander Tsyuk"'
Autor:
Philipp Latyshev, Alexander Tsyuk, Ruslan Gorbunov, Vladislav Voronenkov, Andrey Zubrilov, Y. G. Shreter, Natalia Bochkareva, Yuri Lelikov, Y.T. Rebane
GaN films with thicknesses up to 3 mm were grown in two custom-made halide vapor phase epitaxy (HVPE) reactors. V-shaped defects (pits) with densities from 1 to 100 cm-2 were found on the surfaces of the films. Origins of pit formation and the proces
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::486113a34a1750fd74f31c0e94e2952d
http://arxiv.org/abs/1902.06465
http://arxiv.org/abs/1902.06465
Autor:
Vladislav Voronenkov, Andrey Zubrilov, Ruslan Gorbunov, Philippe Latyshev, Natalia Bochkareva, Y. S. Lelikov, Y. T. Rebane, Yuriy Shreter, Alexander Tsyuk
Publikováno v:
ECS Transactions. 35:91-97
GaN is widely used in emerging solid state lighting industry, blue lasers, power and RF electronics. Due to the lack of native substrates, most GaN devices are grown on sapphire. Lattice constant in c-plane of GaN and sapphire differs by 14%. High la
Autor:
Alexander Tsyuk, N. I. Bochkareva, Y. T. Rebane, Y. G. Shreter, Y. S. Lelikov, R. I. Gorbunov, F. E. Latyshev, Vladislav Voronenkov, Andrey Zubrilov
Publikováno v:
Semiconductors. 44:794-800
The quantum efficiency of GaN LED structures has been studied at various temperatures and biases. It was found that an efficiency falloff is observed with increasing current density and, simultaneously, the tunnel component of the current through the
Autor:
Y. T. Rebane, Vladislav Voronenkov, Alexander Tsyuk, Natalia Bochkareva, Ruslan Gorbunov, Yuriy Shreter, Philippe Latyshev, Andrey Zubrilov, Y. S. Lelikov
Publikováno v:
ECS Meeting Abstracts. :1474-1474
The effect of growth parameters on stress in thick GaN films grown on sapphire by HVPE method was investigated. We have found two modes of growth with different growth stress. Films grown in one mode have rough surfaces and low stress. The second mod
Autor:
Alexander Tsyuk, Y. G. Shreter, Natalia Bochkareva, Y. T. Rebane, Vladislav Voronenkov, Ruslan Gorbunov, Philippe Latyshev, Y. S. Lelikov, Andrey Zubrilov
Publikováno v:
Applied Physics Letters. 96:133502
The quantum efficiency of GaN-based light-emitting diodes (LEDs) is investigated at temperatures 77–300 K. It is found that the efficiency droop is due to a decrease in the internal quantum efficiency (IQE) in the low-energy part of the emission sp