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pro vyhledávání: '"Alexander N. Magunov"'
Autor:
Alexander N. Magunov
Publikováno v:
Refractometry.
Optical constants of monocrystalline silicon are experimentally determined in the range from 293 K to 700 K using laser lines of 1.06 micrometers and 1.15 micrometers . The quantitative description of spectral and temperature dependencies of the abso
Autor:
Alexander N. Magunov
Publikováno v:
Refractometry.
The quantitative description of interferogram registered in heating of crystal which has a finite angle between two surfaces and irradiating of crystal with sounding laser beam is given. The possibility of continuous measurement in real time of cryst
Publikováno v:
SPIE Proceedings.
Structures obtained using high-energy ion implantation into silicon are the novel object for optical diagnostics'. Implanted layers are characterized by significant spatial blur of optical transitions, contrary to the traditional sharp filmsubstrate
Autor:
Alexander N. Magunov, A. Y. Gasilov
Publikováno v:
SPIE Proceedings.
The automated optical system for the control of spatial distribution of the optical parameters of solids is developed. The possibilities of spectrophotometric method for detection of the low- contrast geometrical and physical inhomogeneities of diele