Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Alexander I. Ozerov"'
Autor:
K. S. Zemtsov, Vasily S. Anashin, R. G. Useinov, Maxim S. Gorbunov, A.E. Kozyukov, Alexander I. Ozerov, Gennady I. Zebrev, Vladimir V. Emeliyanov
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 775:41-45
Mean and partial cross-section concepts and their connections to multiplicity and statistics of multiple cell upsets (MCUs) in highly-scaled digital memories are introduced and discussed. The important role of the experimental determination of the up
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a862e18ebe829685bb9931756df1811b
https://doi.org/10.1016/j.nima.2014.11.106
https://doi.org/10.1016/j.nima.2014.11.106
Autor:
G. I. Zebrev, Boris V. Vasilegin, Vladimir V. Emeliyanov, Andrey A. Antonov, P. N. Osipenko, Alexander I. Chumakov, Alexander V. Klishin, Pavel S. Dolotov, Alexander I. Ozerov, Alexey L. Vasiliev, Andrey V. Yanenko, Maxim S. Gorbunov, Vasily S. Anashin
Publikováno v:
IEEE Transactions on Nuclear Science. 60:2762-2767
The design and experimental results are presented for the fault-tolerant 0.35 im SOI CMOS microprocessor. DICE-like cells are shown to be vulnerable to SEU during “read” and “write” modes.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::890d2d2dc5b935f419865b2763719f1d
https://doi.org/10.1109/tns.2013.2241453
https://doi.org/10.1109/tns.2013.2241453
Autor:
K. S. Zemtsov, Vladimir V. Emeliyanov, Alexander I. Ozerov, R. G. Useinov, Maxim S. Gorbunov, Gennady I. Zebrev
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets (MCU) in the nanoscale (with feature sizes less than 100 nm) memories. Microdosimetric model of the MCU cross- secti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b76a122834bef8547d2581e68798cb8d
https://doi.org/10.1109/radecs.2015.7365637
https://doi.org/10.1109/radecs.2015.7365637
Autor:
Timofey A. Maksimenko, Grigory A. Protopopov, Linaris R. Bakirov, Vasily S. Anashin, Pavel A. Chubunov, Aleksandr E. Koziukov, Alexander I. Ozerov
Publikováno v:
2015 IEEE Radiation Effects Data Workshop (REDW).
The paper presents test results of electronic components candidate for spacecraft obtained on low (3-6 MeV/nucleon) and high (20-40 MeV/nucleon) energy heavy ion test facilities. In addition to obtaining experimental data, the purpose of the study wa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1b4d11d9d1d8e6ed415e5e2a23b77f9
https://doi.org/10.1109/redw.2015.7336738
https://doi.org/10.1109/redw.2015.7336738
Autor:
Alexander S. Bakerenkov, Vasily S. Anashin, Alexander E. Kozyukov, Alexander S. Vatuev, Vladimir V. Emeliyanov, Vladimir A. Skuratov, Vladimir V. Belyakov, Alexey V. Besetskiy, Alexander I. Ozerov
Publikováno v:
2012 IEEE Radiation Effects Data Workshop.
This paper presents SEE test facility as well as its opportunities of integrated microcircuit tests in the temperature range. The used method of heating and cooling of DUT was considered in vacuum chamber of test facility.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc2d66cb2ebdcfc47d9c9149e475be1a
https://doi.org/10.1109/redw.2012.6353725
https://doi.org/10.1109/redw.2012.6353725
Autor:
Andrey V. Yanenko, Andrey A. Antonov, R. G. Useinov, P. N. Osipenko, Alexander I. Chumakov, Maxim S. Gorbunov, Vladimir V. Emeliyanov, Alexander A. Pechenkin, Vasily S. Anashin, Boris V. Vasilegin, Alexander I. Ozerov, G. I. Zebrev
Publikováno v:
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
The results on SEE sensitivity of 0.5 $\mu$ m SOI CMOS microprocessor are presented and discussed. The comparative analysis of different test techniques (particle accelerator, pulsed laser technique and $^{252}$ Cf fission source) is provided for the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b6e19170a966a9e52d7cb6dcad05bb0d
https://doi.org/10.1109/radecs.2011.6131444
https://doi.org/10.1109/radecs.2011.6131444