Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Alexander Eigenraam"'
Autor:
Otto Hasekamp, Jelle Talsma, Jochen Campo, Alexander Eigenraam, Paul J. J. Tol, Jens Johansen, Aaldert van Amerongen, Richard van Hees, Martijn Smit, Joris van der Vlugt, Marc Oort, Jeroen Rietjens
Publikováno v:
International Conference on Space Optics — ICSO 2020.
This contribution presents the on-ground characterization and video chain development of the CMOS detector implemented in SPEXone, the five-angle space spectro-polarimeter for the NASA PACE observatory scheduled for launch in 2023. SPEXone is a Dutch
Autor:
Luc Voruz, Nikhil More, Marcos Bavdaz, Marco W. Beijersbergen, Nicolas M. Barrière, David Girou, Sebastiaan Fransen, Alex Bayerle, Ramses Günther, Mark Vervest, Ben Okma, Eric Wille, Boris Landgraf, Alexander Eigenraam, Sjoerd Verhoeckx, Ljubiša Babić, Giuseppe Vacanti, Maximilien J. Collon, Coen van Baren, Enrico Hauser, Laurens Keek
Publikováno v:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX.
The European Space Agency (ESA) is developing the Athena (Advanced Telescope for High ENergy Astrophysics) X-ray telescope, an L-class mission in their current Cosmic Vision cycle for long-term planning of space science missions. Silicon Pore Optics
Autor:
Marcos Bavdaz, Marco W. Beijersbergen, Boris Landgraf, Sjoerd Verhoeckx, Maximilien J. Collon, Mark Vervest, Ronald Start, Giuseppe Vacanti, Arenda Koelewijn, Laurens Keek, Ben Okma, Michael Krumrey, Nicolas M. Barrière, Coen van Baren, Evelyn Handick, Sebastiaan Fransen, Ramses Günther, Jan-Joost Lankwarden, Alexander Eigenraam, Giuseppe Valsecchi, David Girou, Enrico Hauser, Peter Müller, Luc Voruz, Eric Wille, Jeroen Haneveld, Maurice Wijnperle, Ljubiša Babić
Publikováno v:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX.
Silicon Pore Optic (SPO) is the X-ray mirror technology selected for the Athena X-ray observatory. The optic is modular; in the current design, it is made of about 700 co-aligned mirror modules. SPO is produced as stacks of 35 mirror plates, which ar
Autor:
Maximilien J. Collon, Giuseppe Vacanti, Nicolas M. Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Luc Voruz, Sjoerd Verhoex, Ljubiša Babić, Roy . van der Hoeven, Kim van Straeten, Abdel Chatbi, David Girou, Marco W. Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Ivo Ferreira, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Alexander Eigenraam, Jan Willem den Herder, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Desiree Della Monica Ferreira, Finn E. Christensen, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik, Dervis Vernani
Publikováno v:
International Conference on Space Optics — ICSO 2018.
Autor:
David Girou, Coen van Baren, Boris Landgraf, Giuseppe Vacanti, Marco W. Beijersbergen, Roy van der Hoeven, Sebastiaan Fransen, Brian Shortt, Maximilien J. Collon, Mark Vervest, Alexander Eigenraam, Nicolas M. Barrière, Marcos Bavdaz, Eric Wille, Ramses Günther
Publikováno v:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII.
The European Space Agency (ESA) is studying the ATHENA (Advanced Telescope for High ENergy Astrophysics) X-ray telescope, the second L-class mission in their Cosmic Vision 2015 – 2025 program with a launch spot in 2028. The baseline technology for
Autor:
Sonny Massahi, Eric Wille, Peter Müller, Marcos Bavdaz, Ramses Günther, Brian Shortt, Arenda Koelewijn, Abdelhakim Chatbi, Roy van der Hoeven, Giuseppe Vacanti, Alex Yanson, Coen van Baren, Mark Vervest, Jeroen Haneveld, Paolo Conconi, Nicolas M. Barrière, Michael Krumrey, Giovanni Pareschi, Marco W. Beijersbergen, Finn Erland Christensen, Giuseppe Valsecchi, Maximilien J. Collon, Boris Landgraf, Alexander Eigenraam, Vadim Burwitz
Publikováno v:
SPIE Proceedings.
Silicon Pore Optics is a high-energy optics technology, invented to enable the next generation of high-resolution, large area X-ray telescopes such as the ATHENA observatory, a European large (L) class mission with a launch date of 2028. The technolo
Autor:
Ramon Rijnbeek, R.W. Herfst, Hamed Sadeghian, Alexander Eigenraam, Bert Dekker, Jasper Winters, Nicole Nulkes
Publikováno v:
SPIE Proceedings.
With the device dimensions moving towards the 1X node and below, the semiconductor industry is rapidly approaching the point where existing metrology, inspection and review tools face huge challenges in terms of resolution, the ability to resolve 3D