Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Alexander E. Mag-isa"'
Autor:
Takashi Sumigawa, Bongkyun Jang, Chung-Seog Oh, Hak-Joo Lee, Byungwoon Kim, Takayuki Kitamura, Alexander E. Mag-isa, Jae-Hyun Kim
Publikováno v:
Extreme Mechanics Letters. 14:10-15
Due to the atomistic thinness of graphene, it is non-trivial to measure fracture behaviors of freestanding graphene without any underlying materials. In this study, we present a methodology for measuring the fracture behavior of freestanding natural
Publikováno v:
Materials Today Communications. 25:101387
The in-plane coefficient of thermal expansion (CTE) of freestanding multilayer pristine graphene was directly measured by the thermal bulge method using a white light interferometric microscope. Graphene ribbons with 3, 5, and 10 layers were prepared
Publikováno v:
Materials Letters. 171:312-314
The in-plane coefficient of thermal expansion (CTE) of freestanding single-crystal natural graphite was directly determined using the thermal bulge method. The Scotch tape method was used to obtain 40-nm-thick graphite flakes by the micromechanical c
Autor:
Alexander E. Mag-isa, Jae-Won Jang, Hak-Joo Lee, Yun Hwangbo, Jae-Hyun Kim, Choong-Kwang Lee, Soon-Bok Lee, Seong Su Kim
Publikováno v:
Carbon. 77:454-461
We demonstrate a simple and easy technique to reliably count the number of layers in graphenes with stacking faults. Using lasers with wavelengths of 514 and 633 nm, the optical transmittances of multilayer graphene with Bernal, rhombohedral and arti
Coefficient of thermal expansion measurements for freestanding nanocrystalline ultra-thin gold films
Publikováno v:
International Journal of Precision Engineering and Manufacturing. 15:105-110
The out-of-plane coefficient of thermal expansion (CTE) measurement method, which is named the thermal bulge method, was used to measure the linear CTE values for freestanding nanocrystalline ultra-thin gold films with thicknesses ranging from 115 to
Publikováno v:
Experimental Mechanics. 53:1017-1024
An out-of-plane linear coefficient of thermal expansion (CTE) measurement method was developed to overcome the difficulty in measuring the in-plane deformation of freestanding thin films with a thickness of less than 1 μm. The out-of-plane profile m
Publikováno v:
Nanoscale. 5(23)
Due to the fast development of nanotechnology, we have the capability of manipulating atomic layer systems such as graphene, hexagonal boron nitride and dichalcogenides. The major concern in the 2-dimensional nanostructures is how to preserve their e
Publikováno v:
Journal of Engineering Materials and Technology. 135
Tension–tension fatigue tests were conducted on an electrodeposited copper film with a thickness of 12 μm under four levels of maximum stress and two levels of mean stress. Statistical characteristics of the measured fatigue lives were analyzed us
Publikováno v:
Applied Physics Letters. 107:163103
We present evidence of moderate current density, when accompanied with high temperature, promoting migration of foreign atoms on the surface of multi-layer graphene. Our in situ transmission electron microscope experiments show migration of silicon a
Publikováno v:
2D Materials. 2:034017
The device conceptualization and proof-of-concept testing of two-dimensional (2D) materials are performed with their pristine forms that are obtained through the micromechanical cleaving of bulk natural crystals, i.e., the so-called Scotch tape metho