Zobrazeno 1 - 10
of 102
pro vyhledávání: '"Alexander, Gerlach"'
Autor:
Linus Pithan, Vladimir Starostin, David Mareček, Lukas Petersdorf, Constantin Völter, Valentin Munteanu, Maciej Jankowski, Oleg Konovalov, Alexander Gerlach, Alexander Hinderhofer, Bridget Murphy, Stefan Kowarik, Frank Schreiber
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 6, Pp 1064-1075 (2023)
Recently, there has been significant interest in applying machine-learning (ML) techniques to the automated analysis of X-ray scattering experiments, due to the increasing speed and size at which datasets are generated. ML-based analysis presents an
Externí odkaz:
https://doaj.org/article/bc42c255ce3747ecbedc3e9071da5fd3
Autor:
Vladimir Starostin, Valentin Munteanu, Alessandro Greco, Ekaterina Kneschaurek, Alina Pleli, Florian Bertram, Alexander Gerlach, Alexander Hinderhofer, Frank Schreiber
Publikováno v:
npj Computational Materials, Vol 8, Iss 1, Pp 1-9 (2022)
Abstract Understanding the processes of perovskite crystallization is essential for improving the properties of organic solar cells. In situ real-time grazing-incidence X-ray diffraction (GIXD) is a key technique for this task, but it produces large
Externí odkaz:
https://doaj.org/article/b202a956084b42a88c396621e69f8a69
Autor:
Qi Wang, Meng-Ting Chen, Antoni Franco-Cañellas, Bin Shen, Thomas Geiger, Holger F. Bettinger, Frank Schreiber, Ingo Salzmann, Alexander Gerlach, Steffen Duhm
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1361-1370 (2020)
We studied the structural and electronic properties of 2,3,9,10-tetrafluoropentacene (F4PEN) on Ag(111) via X-ray standing waves (XSW), low-energy electron diffraction (LEED) as well as ultraviolet and X-ray photoelectron spectroscopy (UPS and XPS).
Externí odkaz:
https://doaj.org/article/10391e42929f4e188f8ef70a458634c6
Autor:
Alexander Hinderhofer, Alessandro Greco, Vladimir Starostin, Valentin Munteanu, Linus Pithan, Alexander Gerlach, Frank Schreiber
Publikováno v:
Journal of Applied Crystallography. 56:3-11
Machine learning (ML) has received enormous attention in science and beyond. Discussed here are the status, opportunities, challenges and limitations of ML as applied to X-ray and neutron scattering techniques, with an emphasis on surface scattering.
Autor:
Christina Samel, Holger Pfaff, Stephanie Stock, Nadine Scholten, Martin Hellmich, Imke Jenniches, Clarissa Lemmen, Michael Kusch, Hildegard Labouvie, Alexander Gerlach, Anna Hagemeier, Peter Haas, Michael Hallek, Antje Dresen
Publikováno v:
BMJ Open, Vol 10, Iss 3 (2020)
IntroductionInternational standards of care require the complete integration of psycho-oncological care into biomedical cancer treatment. The structured integrated, cross-sectoral psycho-oncological programme ‘isPO’ is aiming to ensure a provisio
Externí odkaz:
https://doaj.org/article/20fef446e1684f66a7bdfe0e00d474dd
Autor:
Alexander Hinderhofer, Jan Hagenlocher, Alexander Gerlach, Joachim Krug, Martin Oettel, Frank Schreiber
Publikováno v:
The Journal of Physical Chemistry C. 126:11348-11357
Understanding non-equilibrium phenomena, such as growth, and connecting them to equilibrium phase behavior is a major challenge, in particular for complex multicomponent materials. We use X-ray reflectivity to determine the surface roughness of binar
Autor:
Alessandro Greco, Vladimir Starostin, Evelyn Edel, Valentin Munteanu, Nadine Rußegger, Ingrid Dax, Chen Shen, Florian Bertram, Alexander Hinderhofer, Alexander Gerlach, Frank Schreiber
Publikováno v:
Journal of Applied Crystallography. 55:362-369
The Python package mlreflect is demonstrated, which implements an optimized pipeline for the automated analysis of reflectometry data using machine learning. The package combines several training and data treatment techniques discussed in previous pu
Autor:
Nadine Rußegger, Ana M. Valencia, Lena Merten, Matthias Zwadlo, Giuliano Duva, Linus Pithan, Alexander Gerlach, Alexander Hinderhofer, Caterina Cocchi, Frank Schreiber
Publikováno v:
The Journal of Physical Chemistry C. 126:4188-4198
Autor:
Chengyuan Wang, Nadine Russegger, Giuliano Duva, Oleg V. Konovalov, Maciej Jankowski, Alexander Gerlach, Alexander Hinderhofer, Frank Schreiber
Publikováno v:
Materials Chemistry Frontiers. 6:3422-3430
The thin film growth behaviors of ADT and β-MT-ADT are studied by X-ray diffraction techniques and atomic force microscopy, and the templating effect on the thin film growth process of β-MT-ADT is investigated with DIP as the templating layer.
Autor:
Takuya Hosokai, Clemens Zeiser, Alexander Gerlach, Linus Pithan, Berthold Reisz, Alexander Hinderhofer, Giuliano Duva, Martin Hodas, Jakub Hagara, Frank Schreiber, Valentina Belova, Peter Siffalovic
Publikováno v:
'Journal of Applied Crystallography ', vol: 54, pages: 203-210 (2021)
Journal of Applied Crystallography
Journal of Applied Crystallography
This X-ray diffraction study proves that two α polymorphs of copper pthalocyanine (CuPc) co-exist in vacuum-deposited thin films and provides possible molecular configurations by excluded-volume considerations. Furthermore, atomic force microscopy i