Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Aleksandr Shorokhov"'
Autor:
Aleksandr Shorokhov, Maksim Riabko, Boris I. Afinogenov, Anton N. Sofronov, Anton Medvedev, Stanislav Polonsky
Publikováno v:
Physical Review Applied. 15
We report on experimental detection of 10 nm $\mathrm{Si}$ nanoparticles on $\mathrm{Si}$ surface using spatial modulation microscopy. We show that a simple optical layout with a galvo-mirror allows reliable detection of $9\ifmmode\times\else\texttim
Autor:
Seulgi Lee, I. M. Antropov, Sangwoo Bae, Akinori Ohkubo, Joo Won-Don, Aleksandr Shorokhov, Hosun Yoo, Anton Medvedev, Kyunghun Han, Taehyun Kim, Minhwan Seo, Boris I. Afinogenov, Jeang Eun-Hee, Vladimir O. Bessonov, Maksim Riabko, Lee Sang-Min, Anton N. Sofronov, Ingi Kim
Publikováno v:
Nonlinear Optics and its Applications 2020.
Detection of a single nanoparticle on a bare silicon wafer has been a challenge in the semiconductor industry for decades. Currently, the most successful and widely used technique is dark-field microscopy. However, it is not capable of detecting sing
Publikováno v:
E3S Web of Conferences, Vol 175, p 13012 (2020)
The article is devoted to the research of features of economic mentality of managers of the companies, representatives of different generations (X, Y) in interrelation with popular methodologies of project management. We studied the components of the