Zobrazeno 1 - 10
of 280
pro vyhledávání: '"Aleksander Jablonski"'
Publikováno v:
Surface and Interface Analysis.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5bff3a86afeb3beb270fdac64b9fd78e
https://doi.org/10.1002/sia.7217
https://doi.org/10.1002/sia.7217
Autor:
Aleksander Jablonski
Publikováno v:
Surface Science. 688:14-24
The attenuation length approach for determination of an overlayer thickness is analyzed in the case of overlayer/substrate systems in which both materials distinctly differ; in particular, they exhibit considerably different electron transport proper
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::786c92c3b1b07899111229c6bd125c8d
https://doi.org/10.1016/j.susc.2019.05.004
https://doi.org/10.1016/j.susc.2019.05.004
Autor:
Cedric J. Powell, Aleksander Jablonski
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 236:27-32
We analyzed the experiments of Rubio-Zuazo and Castro [J. Electron Spectrosc. Relat. Phenom. 184 (2011) 384] who reported measurements of effective attenuation lengths (EALs) of gold for electron energies between 1 keV and 15 keV. They deposited thin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54ec0c21ab063babe6017795e4e5234a
https://doi.org/10.1016/j.elspec.2019.04.002
https://doi.org/10.1016/j.elspec.2019.04.002
Autor:
Aleksander Jablonski
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 234:34-46
A very simple method for determining the photoelectron partial intensities and reduced partial intensities for HAXPES photoelectrons is proposed. For these calculations, it is sufficient to know a formalism expressing the photoelectron signal intensi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e92fb8f227f2b356c33d97ce4077b1e3
https://doi.org/10.1016/j.elspec.2019.05.009
https://doi.org/10.1016/j.elspec.2019.05.009
Autor:
Aleksander Jablonski
Publikováno v:
Computer Physics Communications. 235:489-501
The objective of this study was to design an algorithm for calculating the Chandrasekhar function ( H -function) dedicated for theoretical models of photoelectron transport in condensed matter. It has been shown that only the H -function values for n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f171acc0a29d5185aa86153a33973740
https://doi.org/10.1016/j.cpc.2018.07.005
https://doi.org/10.1016/j.cpc.2018.07.005
Publikováno v:
Materials
Mo disulfide overlayers with the thickness exceeding 1.77 nm were obtained on Si substrates through mechanical exfoliation. The resulting Mo disulfide flakes were then analyzed ex situ using combination of Auger electron spectroscopy (AES), elastic-p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::a6823b8c1c81d7ce8123da5be7a5a2cc
https://pubmed.ncbi.nlm.nih.gov/32823911
https://pubmed.ncbi.nlm.nih.gov/32823911
Autor:
Aleksander Jablonski
Publikováno v:
Computer Physics Communications. 272:108233
Quantitative analysis by X-ray photoelectron spectroscopy (XPS) requires knowledge of a theoretical model relating different features of recorded spectra with needed characteristics of a studied sample. An advanced theoretical approach describing an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4868d3c43fd0f01266088842bbc19323
https://doi.org/10.1016/j.cpc.2021.108233
https://doi.org/10.1016/j.cpc.2021.108233
Publikováno v:
Applied Surface Science. 437:347-356
The step-by-step growth of yttrium oxide layer was controlled in situ using X-ray photoelectron spectroscopy (XPS). The O/Y atomic concentration (AC) ratio in the surface layer of finally oxidized Y substrate was found to be equal to 1.48. The as-gro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d47f8cbcb47c67cc712879c7299bc13
https://doi.org/10.1016/j.apsusc.2017.12.121
https://doi.org/10.1016/j.apsusc.2017.12.121
Autor:
Aleksander Jablonski
Publikováno v:
Surface Science. 667:121-137
Growing availability of synchrotron facilities stimulates an interest in quantitative applications of hard X-ray photoemission spectroscopy (HAXPES) using linearly polarized radiation. An advantage of this approach is the possibility of continuous va
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::971319e7e231480fe7f08245afcaf4aa
https://doi.org/10.1016/j.susc.2017.10.008
https://doi.org/10.1016/j.susc.2017.10.008
Autor:
Aleksander Jablonski
Publikováno v:
Journal of Surface Analysis. 24:115-122
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff83e6627ecacdc17496b893fdba8448
https://doi.org/10.1384/jsa.24.115
https://doi.org/10.1384/jsa.24.115