Zobrazeno 1 - 10
of 122
pro vyhledávání: '"Albert J. P. Theuwissen"'
Autor:
Xiaoliang Ge, Albert J. P. Theuwissen
Publikováno v:
Sensors, Vol 18, Iss 3, p 707 (2018)
This paper presents a temporal noise analysis of charge-domain sampling readout circuits for Complementary Metal-Oxide Semiconductor (CMOS) image sensors. In order to address the trade-off between the low input-referred noise and high dynamic range,
Externí odkaz:
https://doaj.org/article/f5f3803942f54d17b1369ffb49f47c2c
Autor:
Liqiang Han, Albert J. P. Theuwissen
Publikováno v:
IEEE Solid State Circuits Letters, 4
This letter introduces a Gm-cell-based CMOS image sensor (CIS) achieving deep subelectron noise performance. The CIS presents a new compensation block and low-noise current source to improve the performance of the Gm pixel. Furthermore, an optional f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::78b2cfdca125eb1842cd9545b30b0fa8
https://doi.org/10.1109/lssc.2021.3089364
https://doi.org/10.1109/lssc.2021.3089364
Autor:
Albert J. P. Theuwissen, Shuang Xie
Publikováno v:
IEEE Sensors Journal, 20(1)
This paper presents methodologies for suppressing the spatial and the temporal noise in a CMOS image sensor (CIS). First of all, it demonstrates by using a longer-length column bias transistor, both the fixed pattern noise (FPN) and temporal noise ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::83c0b602e23682fc63c002d1a64b081e
https://doi.org/10.1109/jsen.2019.2941122
https://doi.org/10.1109/jsen.2019.2941122
Autor:
Shuang Xie, Albert J. P. Theuwissen
Publikováno v:
IEEE Sensors Journal. 19:7849-7860
This paper proposes various types of on-chip smart temperature sensors, intended for thermal compensation of dark current in CMOS image sensors (CIS). It proposes four different architectures of metal–oxide–semiconductor (MOS)-based and bipolar j
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e1939b3f75a9a7d354e1288e527b8ebc
https://doi.org/10.1109/jsen.2019.2919655
https://doi.org/10.1109/jsen.2019.2919655
Autor:
Fei Wang, Albert J. P. Theuwissen
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 66:930-940
In this paper, different methodologies are employed to improve the linearity performance of a prototype CMOS image sensor (CIS). First, several pixel structures, including a novel pixel design based on a capacitive trans-impedance amplifier (CTIA), a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71377f4ec0bfeda84d2596c254a19c3b
https://doi.org/10.1109/tcsi.2018.2872627
https://doi.org/10.1109/tcsi.2018.2872627
Autor:
Albert J. P. Theuwissen
Publikováno v:
ISSCC
2021 IEEE International Solid-State Circuits Conference, ISSCC 2021-Digest of Technical Papers
2021 IEEE International Solid-State Circuits Conference, ISSCC 2021-Digest of Technical Papers
One of the fastest growing markets in the semiconductor industry is being driven by businesses in the solid-state imaging sector. An overview of the world-wide CIS (CMOS Image Sensor) market is illustrated in Figure 1.4.1. The actual CAGR (compound a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f36d4c9a08c8329a6266e096d6a4da65
https://doi.org/10.1109/isscc42613.2021.9366058
https://doi.org/10.1109/isscc42613.2021.9366058
Autor:
Albert J. P. Theuwissen, Accel Abarca
Publikováno v:
Micromachines
Micromachines, 11(7)
Volume 11
Issue 7
Micromachines, Vol 11, Iss 665, p 665 (2020)
Micromachines, 11(7)
Volume 11
Issue 7
Micromachines, Vol 11, Iss 665, p 665 (2020)
This article presents in-pixel (of a CMOS image sensor (CIS)) temperature sensors with improved accuracy in the spatial and the temporal domain. The goal of the temperature sensors is to be used to compensate for dark (current) fixed pattern noise (F
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::714f0e39ae56e85b32f647f1662cd87e
https://doi.org/10.3390/mi11070665
https://doi.org/10.3390/mi11070665
Autor:
Shuang Xie, Albert J. P. Theuwissen
Publikováno v:
IEEE Sensors Journal, 20(5)
This paper presents a CMOS image sensor (CIS) with a zoom ADC, to quantize in-pixel temperature sensors, as well as for faster readout speed of the image pixels while maintaining low quantization noise. The proposed 15 bit zoom ADC has a 4 bit Unit C
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::51a865461d3d343d06d57b9b84b3456f
http://resolver.tudelft.nl/uuid:ae6f26ef-2327-4a03-9f21-fc9f1b35c664
http://resolver.tudelft.nl/uuid:ae6f26ef-2327-4a03-9f21-fc9f1b35c664
Autor:
Shuang Xie, Albert J. P. Theuwissen
Publikováno v:
IEEE Transactions on Circuits and Systems Part 2: Express Briefs, 67(6)
This brief proposes a successive approximation register (SAR) analog-to-digital converter (ADC) whose readout speed is improved by 33%, through applying a digital error correction (DEC) method, compared to an alternative without using the DEC techniq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6dadf571e748ed078b4eb8a5bc936092
http://resolver.tudelft.nl/uuid:d079392b-c89e-4ac7-a493-cbd75a752ee0
http://resolver.tudelft.nl/uuid:d079392b-c89e-4ac7-a493-cbd75a752ee0
Publikováno v:
IEEE Journal of Solid-State Circuits. 53:2970-2981
This paper presents a highly linear CMOS image sensor (CIS) designed in a commercial 0.18- $\mu$ m CIS technology. A new type of pixel is proposed based on the linearity analysis of a conventional 4T active pixel. The new type of pixel can mitigate t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5d9881745ca945def3e768336de6015
https://doi.org/10.1109/jssc.2018.2856252
https://doi.org/10.1109/jssc.2018.2856252