Zobrazeno 1 - 1
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pro vyhledávání: '"Albert J. Huis in t' Veld"'
Autor:
G.R.B.E. Römer, Albert J. Huis in t’ Veld, J.Z.P. Skolski, Jozef Vincenc Oboňa, Jeff Th. M. De Hosson, Vaclav Ocelik
Publikováno v:
ICALEO 2014 Congress Proceedings
Electron back-scatter diffraction (EBSD) technique, commonly used to study the microstructural characteristics of materials, was employed for the investigation of the surface damage induced through ultra-short laser pulses. Single-crystal silicon sur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::713a0c2e8d1cfc391762913b3bd1d68b
http://www.mendeley.com/research/microstructural-characterization-surface-damage-through-ultrashort-laser-pulses
http://www.mendeley.com/research/microstructural-characterization-surface-damage-through-ultrashort-laser-pulses
