Zobrazeno 1 - 10
of 101
pro vyhledávání: '"Albert Henins"'
Autor:
Yutaka Yamagata, Hirohiko M. Shimizu, Robert Valdillez, Takuya Hosobata, R. Haun, Takuhiro Fujiie, Masaaki Kitaguchi, Albert Henins, Benjamin Heacock, Masahiro Takeda, Katsuya Hirota, Albert Young, Dmitry A. Pushin, Michael G. Huber
Publikováno v:
Science. 373:1239-1243
Structure factors describe how incident radiation is scattered from materials such as silicon and germanium and characterize the physical interaction between the material and scattered particles. We use neutron pendell\"{o}sung interferometry to make
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8ceb3025d17cf9e8851fe9075390ae77
https://doi.org/10.1126/science.abc2794
https://doi.org/10.1126/science.abc2794
Publikováno v:
Journal of Research of the National Institute of Standards and Technology. 126
The NIST Vacuum Double-Crystal Spectrometer (VDCS) has been modernized and is now capable of recording reference-free wavelength-dispersive spectra in the 2 keV to 12 keV x-ray energy range. The VDCS employs crystals in which the lattice spacings are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d07111677a477f1e9414ade87625812d
https://doi.org/10.6028/jres.126.049
https://doi.org/10.6028/jres.126.049
Publikováno v:
Powder Diffr
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of the instrument performance of both X-ray and neutron powder diffractometers. This report des
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6a96355d4aa26d7db4de1bd8fcd0e649
https://doi.org/10.1017/s0885715620000366
https://doi.org/10.1017/s0885715620000366
Autor:
John E. Bonevich, David R. Black, James P. Cline, Joseph J. Ritter, Pamela S. Whitfield, Albert Henins, Marcus H. Mendenhall, James J. Filliben
Publikováno v:
Journal of Research of the National Institute of Standards and Technology. 125
This rather long-standing project has resulted in a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) for the analysis of crystallite size from a consideration of powder diffraction line profile broadening. It co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d2c7c24782865424990cafffcc962fb
https://doi.org/10.6028/jres.125.020
https://doi.org/10.6028/jres.125.020
Publikováno v:
Radiat Phys Chem Oxf Engl 1993
We report recent advances in absolute x-ray wavelength metrology in the context of producing modern standard reference data. Primary x-ray wavelength standards are produced today using diffraction spectrometers using crystal optics arranged to be ope
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7a6209d825c9a52b8189d103167e87bd
https://pubmed.ncbi.nlm.nih.gov/32489233
https://pubmed.ncbi.nlm.nih.gov/32489233
Autor:
David R. Black, James J. Filliben, James P. Cline, Craig M. Brown, Marcus H. Mendenhall, Albert Henins
Publikováno v:
Powder Diffr
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to evaluate specific aspects of instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM 660c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::edade2c74c27a2ccf4b54f35c0b70579
https://europepmc.org/articles/PMC7727230/
https://europepmc.org/articles/PMC7727230/
Autor:
Albert Henins, Pamela S. Whitfield, Marcus H. Mendenhall, David R. Black, Craig M. Brown, James P. Cline, James J. Filliben
Publikováno v:
Powder Diffraction. 33:202-208
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1879b, the third gene
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6b39397d7b1a4239986a30564cdfe3ae
https://doi.org/10.1017/s0885715618000465
https://doi.org/10.1017/s0885715618000465
Publikováno v:
Appl Opt
A Cauchois-type spectrometer utilizing the (203) lattice planes at an oblique angle of 11.53° to the normal to the surface of a quartz transmission crystal recorded the Kα and Kβ spectral lines of six elements from Fe to Ag in the 6–22 keV energ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::65a2b0b433b01360b2b9b86f02dff969
https://europepmc.org/articles/PMC7274499/
https://europepmc.org/articles/PMC7274499/
We present newly measured spectra of the X-ray emission of a molybdenum metal anode subject to electron bombardment, using a very high dispersion silicon double-crystal spectrometer. The measurement includes the dipole-allowed KL, KM, and KN emission
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8e591835e1282ecf2a55bd31b15d62c7
https://europepmc.org/articles/PMC7043325/
https://europepmc.org/articles/PMC7043325/
Autor:
Pamela S. Whitfield, James J. Filliben, James P. Cline, David R. Black, Donald Windover, Marcus H. Mendenhall, Albert Henins
Publikováno v:
Powder Diffraction. 31:211-215
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1878b, the third gene
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::639f554094cf378713bd0dc37396ba40
https://doi.org/10.1017/s0885715616000336
https://doi.org/10.1017/s0885715616000336