Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Alan J. Curran"'
Autor:
Alan J. Curran, Xuanji Yu, Jiqi Liu, Dylan J. Colvin, Nafis Iqbal, Thomas Moran, Brent Brownell, Mengjie Li, Kristopher O. Davis, Bryan D. Huey, Jean-Nicolas Jaubert, Jennifer L. Braid, Laura S. Bruckman, Roger H. French
Publikováno v:
Frontiers in Energy Research, Vol 11 (2023)
We have studied the degradation of both full-sized modules and minimodules with PERC and Al-BSF cell variations in fields while considering packaging strategies. We demonstrate the implementations of data-driven tools to analyze large numbers of modu
Externí odkaz:
https://doaj.org/article/946333b96385473696d291366884c525
Autor:
Jean-Nicolas Jaubert, Dylan J. Colvin, Parag Banerjee, Bryan D. Huey, Alan J. Curran, Andrew G. Norman, Jeya Prakash Ganesan, Dana B. Sulas-Kern, Roger H. French, Kristopher O. Davis, Steven P. Harvey, Fang Li, Nafis Iqbal, GovindaSamy TamizhMani, Joseph Karas
Publikováno v:
IEEE Journal of Photovoltaics. 12:62-72
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c7e50d4afdf4db2e4aa908bc09229da
https://doi.org/10.1109/jphotov.2021.3124751
https://doi.org/10.1109/jphotov.2021.3124751
Autor:
Menghong Wang, Roger H. French, Jiqi Liu, Alan J. Curran, Erdmut Schnabel, Michael Köhl, Jennifer L. Braid
Publikováno v:
Solar Energy. 224:1291-1301
Degradation and partial shading impact the long-term reliability and power production of photovoltaic (PV) modules and power plants. Time-series power ( P mp ) and current–voltage (I-V) curve datastreams from PV modules enable a remote diagnostic a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6cf71db0bf1e94dc57312b3b41490c9
https://doi.org/10.1016/j.solener.2021.06.022
https://doi.org/10.1016/j.solener.2021.06.022
Autor:
Bryan D. Huey, Thomas Moran, Roger H. French, Jean-Nicolas Jaubert, Jennifer L. Braid, Laura S. Bruckman, Dylan J. Colvin, Ben Yu, Kris Davis, Brent Brownell, Nafis Iqbal, Alan J. Curran
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
To assess the reliability of PERC cells compared to Al-BSF in a commercial setting minimodules with cell and encapsulant combinations are compared in accelerated exposure. In both modified damp heat and modified damp heat with full spectrum light exp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1d11ef6a5525d55e40924d640c30cea
https://doi.org/10.1109/pvsc43889.2021.9519110
https://doi.org/10.1109/pvsc43889.2021.9519110
Autor:
Yinghui Wu, Roger H. French, Jennifer L. Braid, Arafath Nihar, Mehmet Koyutürk, Laura S. Bruckman, Alan J. Curran, Ahmad Maroof Karimi
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
We present the application of FAIR principles to photovoltaic time series data to increase their reusability within the photovoltaic research community. The main requirements for a "FAIRified" dataset is to have a clearly defined data format, and to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91dfd9b2fd77418aed90f7b6cc5e754e
https://doi.org/10.1109/pvsc43889.2021.9518782
https://doi.org/10.1109/pvsc43889.2021.9518782
Autor:
Yu Wang, Scott Julien, Kenneth P. Boyce, Xiaohong Gu, Kai-Tak Wan, Roger H. French, Lucas S. Fridman, Adam W. Hauser, Sophie Napoli, Alan J. Curran, Liang Ji, Nicholas R. Wheeler, Andrew Fairbrother, Laura S. Bruckman, Gregory S. O'brien, Wei-Heng Huang, Michael D. Kempe
Publikováno v:
IEEE Journal of Photovoltaics. 9:1374-1381
Photovoltaic (PV) module backsheets degrade at different rates because of the specific polymeric materials and the local exposure environments of the installations. Studies of real-world backsheet degradation provide valuable information to understan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27d8e835f860b32a7bb0002e0893ef7c
https://doi.org/10.1109/jphotov.2019.2928700
https://doi.org/10.1109/jphotov.2019.2928700
Autor:
Menghong Wang, Bryan D. Huey, Roger H. French, Jianfang Dai, Eric Schneller, Alexandra Longacre, Alan J. Curran, Kristopher O. Davis, Michael Martin, Laura S. Bruckman, Jean-Nicolas Jaubert, Jennifer L. Braid, Oleg Kolosov, Thomas Moran
The open circuit voltage (VOC) is a critical and common indicator of solar cell performance as well as degradation, for panel down to lab-scale photovoltaics. Detecting VOC at the nanoscale is much more challenging, however, due to experimental limit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::57220def5b1ecd7e6a785d0a53029f4d
https://doi.org/10.1007/s10853-020-04736-x
https://doi.org/10.1007/s10853-020-04736-x
Autor:
Roger H. French, Bryan D. Huey, Jianfang Dai, Carolina M. Whitaker, Kristopher O. Davis, Thomas Moran, Laura S. Bruckman, Jennifer L. Braid, Alan J. Curran, Nafis Iqbal, Menghong Wang, Jean-Nicolas Jaubert, Dylan J. Colvin
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
Minimodules with half-cell variants of multi-Si Al-BSF, mono-Si bifacial PERC, and multi-Si bifacial PERC, with backside encapsulant variations of UV cutoff and white EVA and POE are exposed, stepwise, to modified damp heat (80°C/85%RH) conditions.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46dc544b87d058cb2242d1eb3f74e724
https://doi.org/10.1109/pvsc45281.2020.9300990
https://doi.org/10.1109/pvsc45281.2020.9300990
Autor:
Ben X. J. Yu, Bryan D. Huey, Alan J. Curran, Eric Schneller, Nafis Iqbal, Roger H. French, Jean-Nicolas Jaubert, Kristopher O. Davis, Menghong Wang, Roger A. Ristau, Tamil S. Sakthivel, Sudipta Seal, Dylan J. Colvin
Publikováno v:
Solar Energy Materials and Solar Cells. 235:111468
Reliability and durability tests play a key role in the photovoltaic (PV) industry by minimizing potential failure risks for both existing and new cell and module technologies. In this work, a detailed study of contact degradation in monocrystalline
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0446d9917b95adf055fc7110305d810
https://doi.org/10.1016/j.solmat.2021.111468
https://doi.org/10.1016/j.solmat.2021.111468
Autor:
Jianfang Dai, Shiyi Qin, Arushi Pradhan, Muhammad Syaheen Sazally, Bryan D. Huey, Roger H. French, Laura S. Bruckman, Jean-Nicolas Jaubert, Erika L. Anderson, Alan J. Curran, Eric Schneller, Kristopher O. Davis, Menghong Wang, Sean M. Morrison, Jennifer L. Braid
Publikováno v:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC).
Monocrystalline PERC and multicrystalline Al-BSF cells were fabricated as 4-cell mini-modules with EVA encapsulant, and low, medium, and high vapor transmission rate (VTR) backsheets. Mini-modules were subjected to a total of 2500 hours of damp heat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1443e82e4db82ff2fe9c2d12eb0613c7
https://doi.org/10.1109/pvsc40753.2019.9198980
https://doi.org/10.1109/pvsc40753.2019.9198980