Voltage- and current-activated metal–insulator transition in VO2-based electrical switches: a lifetime operation analysis

Autor: Aurelian Crunteanu, Julien Givernaud, Jonathan Leroy, David Mardivirin, Corinne Champeaux, Jean-Christophe Orlianges, Alain Catherinot and Pierre Blondy

Publikováno v: Science and Technology of Advanced Materials, Vol 11, Iss 6, p 065002 (2010)

Vanadium dioxide is an intensively studied material that undergoes a temperature-induced metal–insulator phase transition accompanied by a large change in electrical resistivity. Electrical switches based on this material show promising properties

Externí odkaz: https://doaj.org/article/20cb33fa741b463a947c3e52e37f4bfe

Modeling and characterization of microwave breakdown at atmospheric pressure in OMUX filters

Autor: Hervé Dillenbourg, Kamel Frigui, Stephane Bila, Serge Verdeyme, Damien Pacaud, Alain Catherinot, Jérôme Puech, Laetitia Estagerie, Dominique Baillargeat

Publikováno v: International Journal of RF and Microwave Computer-Aided Engineering. 24:46-54

For output multiplexer (OMUX) filters placed in telecommunication satellites, microwave breakdown happens in an involuntary and undesirable way during tests at atmospheric pressure. This avalanche phenomenon is due to exponential growth of the electr

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::00ab087b9b085f018963a515bf7d6b66
https://doi.org/10.1002/mmce.20712

Microwave Power Limiting Devices Based on the Semiconductor–Metal Transition in Vanadium–Dioxide Thin Films

Autor: Corinne Champeaux, Arnaud Pothier, Aurelian Crunteanu, Julien Givernaud, Jean-Cristophe Orlianges, Pierre Blondy, Alain Catherinot

Publikováno v: IEEE Transactions on Microwave Theory and Techniques
IEEE Transactions on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers, 2010, 58, pp.2352-2361. ⟨10.1109/TMTT.2010.2057172⟩

International audience; reversible semiconductor-to-metal transition (SMT) of vanadium-dioxide thin films integrated on coplanar waveguides. We designed, simulated, and fabricated devices, which can be reversibly driven from a low-loss ( 20 dB) as th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a25c2d5789da532888fdd7996faa8003
https://doi.org/10.1109/tmtt.2010.2057172

Numerical modelling and characterization of the microwave breakdown in OMUX filters

Autor: Serge Verdeyme, Hervé Dillenbourg, Alain Catherinot, Jérôme Puech, Dominique Baillargeat, Laetitia Estagerie, Stephane Bila, Kamel Frigui, Damien Pacaud

Publikováno v: 2015 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO).

This paper deals with the microwave breakdown phenomenon that can appear in output multiplexer filters for telecommunications satellites. In order to model this phenomenon a multidisciplinary approach with a combination of three fields of science was

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b36474cc2ea957ded12540d8f48835ea
https://doi.org/10.1109/nemo.2015.7415046

Gamma radiation effects on RF MEMS capacitive switches

Autor: Jean-Louis Cazaux, L. Marchand, Pascal Tristant, Claude Drevon, Alain Catherinot, Arnaud Pothier, Olivier Vendier, Frédéric Dumas-Bouchiat, Aurelian Crunteanu, Pierre Blondy, Corinne Champeaux

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2006, 49 (9-16), pp.1741-1746
Microelectronics Reliability, Elsevier, 2006, 46 (9-11), pp.1741-1746. ⟨10.1016/j.microrel.2006.07.065⟩

Proceedings of the 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. Wuppertal, Germany 3rd-6th October 2006; International audience; Dielectric-based RF MEMS capacitive switches were fabricated and characteriz

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8faeae88b46a7b4fd96740720a26e3a0
https://doi.org/10.1016/j.microrel.2006.07.065