Aging Model for Life Prediction and Simulation of Organic Light-Emitting Diodes (OLEDs)

Autor: Alaa Alchaddoud, Laurent Canale, Pascal Dupuis, J. Marcos Alonso, Georges Zissis, Guirguis Z. Abdelmessih

Publikováno v: 2019 IEEE International Conference on Environment and Electrical Engineering and 2019 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe)
2019 IEEE International Conference on Environment and Electrical Engineering and 2019 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), Jun 2019, Genova, Italy. pp.1-6, ⟨10.1109/EEEIC.2019.8783814⟩
BASE-Bielefeld Academic Search Engine

This paper proposes a dynamic characterization of OLED aging process. The OLEDs are characterized by a very low dynamic resistance as well as a strong capacitive behavior. Moreover, the OLEDs are very sensitive to over-currents. Thus, the OLED contro

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a475a03c1ed5ffda5d9811c29d90882
https://hal.archives-ouvertes.fr/hal-02435212

Effect of thermal and electrical stress on photometric, radiometric, and colorimetric characteristics of large area white organic light emitting diodes

Autor: Jamal Rammal, Alaa Alchaddoud, Laurent Canale, Georges Zissis

Publikováno v: 2018 IEEE Industry Applications Society Annual Meeting (IAS2018)
2018 IEEE Industry Applications Society Annual Meeting (IAS2018), Sep 2018, Portland, United States. pp.1-5, ⟨10.1109/IAS.2018.8544590⟩
IAS

The aim of this paper is to identify the photometric, radiometric, and colorimetric signatures of degradations of large area white organic light emitting diodes (Philips GL55, 41cm2 active area), subjected to various stress conditions. Nine devices h

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1af7eea1644f3e17f25a935514aa947d
https://hal.archives-ouvertes.fr/hal-02435713

Microwave Characterization of Silicon Carbide Sample at the ISM Band from 25°C to 165°C

Autor: Rammal W, Farah Salameh, Fouany J, Alaa Alchaddoud, Laurent Canale, Taoubi M, Jamal Rammal

Publikováno v: Journal of Electrical Engineering and Electronic Technology
Journal of Electrical Engineering and Electronic Technology, 2018, 07 (02), ⟨10.4172/2325-9833.1000160⟩

This article presents a microwave characterization at the ISM band (2.45 GHz) for the dielectric properties of a Silicon Carbide sample with high loss tangent from 25°C to 165°C. Different techniques were used to characterize the SiC sample: the cy

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e614d108529c1d465c1283077592c4f7
https://hal.archives-ouvertes.fr/hal-02559541

OLED ageing signature characterization under combined thermal and electrical stresses

Autor: Alaa Alchaddoud, Georges Zissis, Laurent Canale, Pascal Dupuis

Publikováno v: BASE-Bielefeld Academic Search Engine
2014 International Symposium on Electrical Insulating Materials (ISEIM)
2014 International Symposium on Electrical Insulating Materials (ISEIM), Jun 2014, Niigata, Japan. pp.311-314, ⟨10.1109/ISEIM.2014.6870781⟩

OLED are appearing at the industrial scale for purposes such as decorative lighting as well as LCD screen back-lighting. One of their main advantages compared to LED is their reduced light intensity: the luminous flux is produced by a much greater su

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b34f4392891b737ea3c078be4e3421d
https://oatao.univ-toulouse.fr/27193/