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pro vyhledávání: '"Akshay Petkar"'
Autor:
Debasish Dwibedy, Sulagna Dey, Prashant Swarnkar, Patrick Hong, Mitsuyuki Watanabe, Koichiro Hayashi, Jiawei Tao, Chang Siau, Juan Lee, Kapil Verma, Jonathan Huynh, Subodh Taigor, William Mak, Takuya Ariki, Yoshihiko Kamata, Zameer Papasaheb, Hiroyuki Mizukoshi, Takuyo Kodama, Toru Miwa, Norihiro Kamae, Trung Pham, Naoki Ookuma, Ryuji Yamashita, Ching-Huang Lu, Meiling Wei, Tsutomu Higuchi, Hitoshi Miwa, Masahide Matsumoto, Rangarao Samineni, Farookh Moogat, Yuzuru Namai, Yingda Dong, Vivek Saraf, Shunichi Toyama, Muralikrishna Balaga, Aditya Pradhan, Hiroki Yabe, Minoru Yamashita, Sung-En Wang, Kazuhide Yoneya, Ying Yu, Samiksha Agarwal, Gopinath Balakrishnan, Thushara Xavier, Manabu Sakai, Xiaohua Zhang, Yuko Utsunomiya, Yosuke Kato, Sahil Deora, Shuo Chen, Yankang He, Sagar Magia, Akshay Petkar, Hardwell Chibvongodze, Swaroop Kulkarni, Shingo Zaitsu, Toshio Yamamura
Publikováno v:
ISSCC
High floating-gate (FG) to FG coupling and lithography limitations have been preventing 2D-NAND flash from further reduction in die size, (e.g., there is no ISSCC paper discussing a 3b/cell 2D-NAND after 2013 [1,2]). Alternatively, since high-density
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::695c61bd386f24bc627c57ec2303193d
https://doi.org/10.1109/isscc.2017.7870328
https://doi.org/10.1109/isscc.2017.7870328
