Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Akram, Muhammed Nadeem"'
Publikováno v:
In Microelectronics Reliability February 2018 81:362-367
Publikováno v:
International Journal of Metrology and Quality Engineering, Vol 9, p 13 (2018)
An optically controlled high-speed current source located at 4 K is likely to improve the performance of pulse-driven Josephson junction arrays. A custom photodiode module with an Albis PDCS24L InGaAs/InP PIN photodiode is investigated in order to de
Externí odkaz:
https://doaj.org/article/b9149ae23f1c48b69b86a8c29394ac4b