Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Akiya Karen"'
Publikováno v:
ACS Applied Materials & Interfaces. 8:4644-4650
Low-temperature solution-processed perovskite solar cells are attracting immense interest due to their ease of fabrication and potential for mass production on flexible substrates. However, the unfavorable surface properties of planar substrates ofte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37c14f105289778f8150e54ce6224021
https://doi.org/10.1021/acsami.5b11286
https://doi.org/10.1021/acsami.5b11286
Publikováno v:
Surface and Interface Analysis. 46:344-347
TOF-SIMS investigation on various lithium reference materials has been carried out for the characterization of reaction products on electrodes of lithium air batteries (LAB). In conjunction with argon gas cluster ion beam (GCIB) sputtering which can
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1028b92bb3ba15e8ee3a93d3da4f62f5
https://doi.org/10.1002/sia.5508
https://doi.org/10.1002/sia.5508
Autor:
Akiya Karen, Michael E. Zolensky, Shoichi Itoh, Minoru Kusakabe, Hisayoshi Yurimoto, Robert J. Bodnar
Publikováno v:
GEOCHEMICAL JOURNAL. 48:549-560
Copyright © 2014 by The Geochemical Society of Japan. primitive materials in the solar system and chondrite-like materials formed the terrestrial planets, isotopic compositions of chondritic liquid water provide a direct evidence to reveal the origi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cb0dc9dd4e9a3b0c1ddf576c6e8771ca
https://doi.org/10.2343/geochemj.2.0335
https://doi.org/10.2343/geochemj.2.0335
Publikováno v:
e-Journal of Surface Science and Nanotechnology. 12:75-78
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cbac2700e715f7566540fdf907468ad7
https://doi.org/10.1380/ejssnt.2014.75
https://doi.org/10.1380/ejssnt.2014.75
Publikováno v:
Journal of Surface Analysis. 19:76-80
Scanning capacitance microscopy (SCM) is one of techniques imaging two-dimensional carrier distribution in semiconductor devices. We have demonstrated that quantitative analysis of carrier concentration can be performed using calibration curves, whic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::faed31cfe7dd2b405325c10daacd50bf
https://doi.org/10.1384/jsa.19.76
https://doi.org/10.1384/jsa.19.76
Publikováno v:
Applied Surface Science. 255:1096-1099
The orientation of a lysozyme immobilized with a monoclonal antibody was evaluated based on determination of the uppermost surface structure using time-of-flight secondary ion mass spectrometry (TOF-SIMS). Specific peaks of the oriented lysozyme immo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8f0291e6534ce8f7c898fdfbca80a51
https://doi.org/10.1016/j.apsusc.2008.05.056
https://doi.org/10.1016/j.apsusc.2008.05.056
Autor:
T. Takenawa, Takahashi T, M. Koizumi, Hirochika Yagi, K. Eifuku, Naohisa Inoue, Kazuhiko Kashima, K. Masumoto, Akiya Karen, K. Shingu, M. Shinomiya
Publikováno v:
ECS Transactions. 2:453-460
Standards for the measurement procedures of nitrogen concentration in CZ silicon crystals were established for infrared absorption spectroscopy (IR), secondary ion mass spectroscopy (SIMS) and charged particle activation analysis (CPAA) for concentra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24c82b48b21d3430ae5c5f0d6b084ba2
https://doi.org/10.1149/1.2195680
https://doi.org/10.1149/1.2195680
Publikováno v:
Applied Surface Science. :725-728
When analyzing insulating films on silicon substrates by quadrupole SIMS instruments, large variations in secondary ion intensity near the interface often occur. In this paper, we investigated these phenomena by analyzing silicon-nitride films deposi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d61f636269488dc3397232f2c85e9c8
https://doi.org/10.1016/j.apsusc.2004.03.032
https://doi.org/10.1016/j.apsusc.2004.03.032
Publikováno v:
Surface and Interface Analysis. 45:101-102
For secondary ion mass spectrometry of highly electronegative elements, the MCs2+ method provides greater sensitivity but may sometimes afford a different depth profile than the conventional MCs+ method for the same sample. Here, we report the differ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c92c08c179dae0b7f270260bf4a3dcf5
https://doi.org/10.1002/sia.5163
https://doi.org/10.1002/sia.5163