Zobrazeno 1 - 10
of 61
pro vyhledávání: '"Akio Uesugi"'
Autor:
Tomoya Imanishi, Keiju Miyamoto, Shuntaro Higashi, Shunsuke Oki, Akio Uesugi, Koji Sugano, Takanori Aono, Yoshitada Isono
Publikováno v:
IEEJ Transactions on Sensors and Micromachines. 143:13-18
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e8aa07d1c3a1e49564ac47382fbf7c0
https://doi.org/10.1541/ieejsmas.143.13
https://doi.org/10.1541/ieejsmas.143.13
Publikováno v:
Microsystem Technologies. 28(5):1281-1290
Microresonator-based optical sensing has been reported to achieve a high measurement resolution of near-infrared light intensity. The light intensity was measured from the resonant frequency shift with the thermal stress of a silicon doubly clamped b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0653950f906c82c27c711f0b5d5f0235
https://hdl.handle.net/20.500.14094/90009256
https://hdl.handle.net/20.500.14094/90009256
Publikováno v:
Optics Letters. 47(2):373-376
Various nanostructures for single-molecule surface-enhanced Raman spectroscopy (SERS) have been fabricated through a random aggregation process using nanoparticles that can stochastically generate multiple hotspots in the laser spot. This leads to mu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e45250aae004b51091a39d124201d30
http://www.lib.kobe-u.ac.jp/handle_kernel/90008983
http://www.lib.kobe-u.ac.jp/handle_kernel/90008983
Publikováno v:
2023 IEEE 36th International Conference on Micro Electro Mechanical Systems (MEMS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f886188d3b46e15d5d3448c5972a1fea
https://doi.org/10.1109/mems49605.2023.10052493
https://doi.org/10.1109/mems49605.2023.10052493
Publikováno v:
IEEJ Transactions on Sensors and Micromachines. 141:321-326
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f386ada006dc6460b89d73cd5d62175b
https://doi.org/10.1541/ieejsmas.141.321
https://doi.org/10.1541/ieejsmas.141.321
Publikováno v:
Microsystem Technologies. 27(3):997-1005
Near-infrared (NIR) imaging has been used for nondestructive and non-contact inspections in various areas, such as food and medicine inspections and medical diagnoses. The short-wavelength infrared light (SWIR) sensor currently used requires a Peltie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6df3f7c9a8de4bf48c570bde4ac9f427
https://hdl.handle.net/20.500.14094/90008038
https://hdl.handle.net/20.500.14094/90008038
Publikováno v:
IEEJ Transactions on Sensors and Micromachines. 140:72-78
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11d6bb8515d6180d78d42d01ffecbf62
https://doi.org/10.1541/ieejsmas.140.72
https://doi.org/10.1541/ieejsmas.140.72
Publikováno v:
Electronics and Communications in Japan. 104
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b336e1ff6b2e5d83b93b3f16967ef32
https://doi.org/10.1002/ecj.12340
https://doi.org/10.1002/ecj.12340
Publikováno v:
Nanotechnology. 33:505701
The effect of surface potential on the carrier mobility and piezoresistance of core–shell silicon carbide nanowires (SiC NWs) was investigated to realize small and sensitive SiC-microelectromechanical systems sensors. The p-type cubic crystalline S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::835905e3689a4409d787261199034f6b
https://doi.org/10.1088/1361-6528/ac8d11
https://doi.org/10.1088/1361-6528/ac8d11
Publikováno v:
2021 IEEE 34th International Conference on Micro Electro Mechanical Systems (MEMS).
Piezoresistive effects of core-shell silicon carbide (SiC) nanowires (NWs) were experimentally evaluated using a FET-type device with single SiC nanowire as a channel, by electrical resistivity measurement with changing gate voltages. The I d -V g ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b87e5cba732440bf44133063f9e03aad
https://doi.org/10.1109/mems51782.2021.9375210
https://doi.org/10.1109/mems51782.2021.9375210