Zobrazeno 1 - 10
of 67
pro vyhledávání: '"Akimoto Koichi"'
Autor:
Voegeli, Wolfgang, Aoyama, Tomohiro, Akimoto, Koichi, Ichimiya, Ayahiko, Hisada, Yoshiyuki, Mitsuoka, Yoshihito, Mukainakano, Shinichi
Publikováno v:
In Surface Science 2010 604(19):1713-1717
Autor:
Iwasawa, Yusaku, Voegeli, Wolfgang, Shirasawa, Tetsuroh, Sekiguchi, Kouji, Nojima, Takehiro, Yoshida, Ryuji, Takahashi, Toshio, Matsumoto, Masuaki, Okano, Tatsuo, Akimoto, Koichi, Kawata, Hiroshi, Sugiyama, Hiroshi
Publikováno v:
In Applied Surface Science 2008 254(23):7803-7806
Autor:
Sumitani, Kazushi, Masuzawa, Kosuke, Hoshino, Takashi, Yoshida, Ryuji, Nakatani, Sinichiro, Takahashi, Toshio, Tajiri, Hiroo, Akimoto, Koichi, Sugiyama, Hiroshi, Zhang, Xiao-Wei, Kawata, Hiroshi
Publikováno v:
In Surface Science 2007 601(22):5195-5199
Autor:
Voegeli, Wolfgang, Akimoto, Koichi, Urata, Tomoaki, Nakatani, Shinichiro, Sumitani, Kazushi, Takahashi, Toshio, Hisada, Yoshiyuki, Mitsuoka, Yoshihito, Mukainakano, Shinichi, Sugiyama, Hiroshi, Zhang, Xiao-Wei, Kawata, Hiroshi
Publikováno v:
In Surface Science 2007 601(4):1048-1053
Autor:
Takashima, Yoshifumi, Yamane, Takashi, Takeda, Yoshikazu, Soda, Kazuo, Yagi, Shinya, Takeuchi, Tsunehiro, Akimoto, Koichi, Sakata, Makoto, Suzuki, Atsuo, Tanaka, Keisuke, Nakamura, Arao, Hori, Masaru, Morita, Shinzo, Seki, Kazuhiko, Mizutani, Uichiro, Kobayakawa, Hisashi, Yamashita, Koujun, Katoh, Masahiro
Externí odkaz:
http://hdl.handle.net/2237/11989
Autor:
Sumitani, Kazushi, Masuzawa, Kosuke, Hoshino, Takashi, Nakatani, Sinichiro, Takahashi, Toshio, Tajiri, Hiroo, Akimoto, Koichi, Sugiyama, Hiroshi, Zhang, Xiao-Wei, Kawata, Hiroshi
Publikováno v:
In Applied Surface Science 2006 252(15):5288-5291
Publikováno v:
In Thin Solid Films 2006 515(2):444-447
Autor:
Mizuno, Yoshihito, Akimoto, Koichi, Aoyama, Tomohiro, Suzuki, Hidetoshi, Nakahara, Hitoshi, Ichimiya, Ayahiko, Sumitani, Kazushi, Takahashi, Toshio, Zhang, Xiaowei, Sugiyama, Hiroshi, Kawata, Hiroshi
Publikováno v:
In Applied Surface Science 15 October 2004 237(1-4):40-44
Publikováno v:
In Surface Science 1 November 2001 493(1-3):221-226
Autor:
Akimoto, Koichi
Publikováno v:
Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy. 44(2):195-199
Semiconductor interface structures have been studied by employing the technique of grazing incidence X-ray diffraction (GID) with the use of synchrotron radiation. Multiple-wavelength anomalous dispersion (MAD) method, a powerful direct method, has b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=jairo_______::0c56e60774a27d80368fdea92d0253d5
http://hdl.handle.net/10097/28732
http://hdl.handle.net/10097/28732