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pro vyhledávání: '"Ajith, Abhiroop"'
Autor:
Agarwal, Arpit, Ajith, Abhiroop, Wen, Chengtao, Stryzheus, Veniamin, Miller, Brian, Chen, Matthew, Johnson, Micah K., Rincon, Jose Luis Susa, Rosca, Justinian, Yuan, Wenzhen
In manufacturing processes, surface inspection is a key requirement for quality assessment and damage localization. Due to this, automated surface anomaly detection has become a promising area of research in various industrial inspection systems. A p
Externí odkaz:
http://arxiv.org/abs/2309.04590
