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pro vyhledávání: '"Aiken van Waveren"'
Autor:
János L. Lábár, Béla Pécz, Aiken van Waveren, Géraldine Hallais, Léonard Desvignes, Francesca Chiodi
Publikováno v:
Nanomaterials, Vol 13, Iss 6, p 1007 (2023)
A new method is presented to measure strain over a large area of a single crystal. The 4D-ED data are collected by recording a 2D diffraction pattern at each position in the 2D area of the TEM lamella scanned by the electron beam of STEM. Data proces
Externí odkaz:
https://doaj.org/article/92a843a6c3cb46d6aea8cbe8fbbe1b6f
Autor:
Martin Osbild, Stephan Brüning, Elisabeth-Annemarie Gerhorst, Saltuk Savran, Aiken van Waveren
Publikováno v:
Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXVIII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4b311fb0dc5790b2984cbfecc690ebd
https://doi.org/10.1117/12.2647741
https://doi.org/10.1117/12.2647741