Quantitative relationship between interfacial misfit and in-plane grain size of ZnO film.

Autor: Shan Peng Cao, Fei Ye, Ai Yan Xu, Xiang Yu Zhang, Fei Ming Bai

Publikováno v: Journal of Applied Physics; 12/28/2014, Vol. 116 Issue 24, p244302-1-244302-5, 5p, 2 Black and White Photographs, 2 Diagrams, 1 Chart