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pro vyhledávání: '"Ahtaiba , Ahmed Mohamed A."'
Autor:
Ahtaiba , Ahmed Mohamed A.
All atomic force microscope (AFM) images suffer from distortions, which are principally produced by the interaction between the measured sample and the AFM tip. If the three-dimensional shape of the tip is known, the distorted image can be processed
Externí odkaz:
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.604322
