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pro vyhledávání: '"Ahmed Yiwere"'
Autor:
Daniel B. Limbrick, William H. Robinson, Bor-Tyng Lin, Hao Qiu, Ahmed Yiwere, Semiu A. Olowogemo
Publikováno v:
MWSCAS
Technology scaling impacts the probability of masking a propagating transient pulse. This paper presents a technique to improve the electrical masking of logic gates when considering the variation in the process, voltage, and temperature (PVT) for a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f35df5d74ab80f6a812e3f5a88a070d8
https://doi.org/10.1109/mwscas48704.2020.9184651
https://doi.org/10.1109/mwscas48704.2020.9184651
